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Redin, Eduardo Gabriel
PRODUCCION CIENTÍFICO TECNOLÓGICA
Mostrando ítems 1-17 de 17
Artículo
6MV LINAC characterization of a MOSFET dosimeter fabricated in a CMOS process
García Inza, Mariano Andrés
;
Cassani, María Victoria
;
Carbonetto, Sebastián Horacio
;
Casal, M.
;
Redin, Eduardo Gabriel
;
Faigon, Adrián Néstor
(
Pergamon-Elsevier Science Ltd
,
2018-10
)
Artículo
CMOS differential and amplified dosimeter with field oxide N-channel MOSFETs
García Inza, Mariano Andrés
;
Carbonetto, Sebastián Horacio
;
Lipovetzky, José
;
Carra, Martin Javier
;
Redin, Eduardo Gabriel
;
Sambuco Salomone, Lucas Ignacio
;
Faigon, Adrián Néstor
(
Institute of Electrical and Electronics Engineers
,
2014-12
)
Artículo
Comparative analysis of MIS capacitance structures with high-k dielectrics under gamma, 16O and p Radiation
Quinteros, C. P.
;
Sambuco Salomone, Lucas Ignacio
;
Redin, Eduardo Gabriel
;
Rafí, J. M.
;
Zabala, M.
;
Faigón, A.
;
Palumbo, Félix Roberto Mario
;
Campabadal, F.
(
Institute of Electrical and Electronics Engineers
,
2012-03
)
Artículo
Deep electron traps in HfO2-based metal-oxide-semiconductor capacitors
Sambuco Salomone, Lucas Ignacio
;
Lipovetzky, José
;
Carbonetto, Sebastián Horacio
;
García Inza, Mariano Andrés
;
Redin, Eduardo Gabriel
;
Campabadal, F.
;
Faigon, Adrián Néstor
(
Elsevier Science Sa
,
2016-02
)
Artículo
Experimental characterization and numerical modeling of total ionizing dose effects on field oxide MOS dosimeters
Cassani, María Victoria
;
Sambuco Salomone, Lucas Ignacio
;
Carbonetto, Sebastián Horacio
;
Faigon, Adrián Néstor
;
Redin, Eduardo Gabriel
;
García Inza, Mariano Andrés
(
Pergamon-Elsevier Science Ltd
,
2021-05
)
Artículo
Experimental evidence and modeling of non-monotonic responses in MOS dosimeters
Faigon, Adrián Néstor
;
García Inza, Mariano Andrés
;
Lipovetzky, José
;
Redin, Eduardo Gabriel
;
Carbonetto, Sebastián Horacio
;
Sambuco Salomone, Lucas Ignacio
;
Berbeglia, F.
(
Elsevier
,
2013-05
)
Artículo
Field Oxide n-channel MOS Dosimeters Fabricated in CMOS Processes
Lipovetzky, José
;
García Inza, Mariano Andrés
;
Carbonetto, Sebastián Horacio
;
Carra, Martin Javier
;
Redin, Eduardo Gabriel
;
Sambuco Salomone, Lucas Ignacio
;
Faigon, Adrián Néstor
(
Institute of Electrical and Electronics Engineers
,
2013-12
)
Artículo
Floating Gate PMOS Dosimeters Under Bias Controlled Cycled Measurement
García Inza, Mariano Andrés
;
Lipovetzky, José
;
Redin, Eduardo Gabriel
;
Carbonetto, Sebastián Horacio
;
Faigon, Adrián Néstor
(
Institute of Electrical and Electronics Engineers
,
2011-06
)
Artículo
Influence of Interface Traps on MOSFET thermal coefficients and its effects on the ZTC current
García Cozzi, R.
;
Redin, Eduardo Gabriel
;
García Inza, Mariano Andrés
;
Sambuco Salomone, Lucas Ignacio
;
Faigon, Adrián Néstor
;
Carbonetto, Sebastián Horacio
(
Pergamon-Elsevier Science Ltd
,
2022-10
)
Artículo
Modeling Switched Bias Irradiations on Floating Gate Devices: Application to Dosimetry
Sambuco Salomone, Lucas Ignacio
;
García Inza, Mariano Andrés
;
Carbonetto, Sebastián Horacio
;
Lipovetzky, José
;
Redin, Eduardo Gabriel
;
Faigon, Adrián Néstor
(
Institute of Electrical and Electronics Engineers
,
2022-06
)
Artículo
Neutron‐Gamma Dosimetry for BNCT using Field Oxide Transistors with Gadolinium Oxide as Neutron Converter Layer
Gimenez, Melisa Lucía
;
Lipovetzky, José
;
Alcalde Bessia, Fabricio Pablo
;
Longhino, Juan Manuel
;
Tartaglione, Aureliano
;
García Inza, Mariano Andrés
;
Blostein, Juan Jeronimo
;
Carbonetto, Sebastián Horacio
;
Gomez Berisso, Mariano
;
Pérez, Martín
;
Sidelnik, Iván Pedro
;
Redin, Eduardo Gabriel
;
Faigon, Adrián Néstor
(
American Association of Physicists in Medicine
,
2022-02
)
Artículo
New fowler-nordheim injection, charge neutralization, and gamma tests on the REM RFT300 RADFET dosimeter
Lipovetzky, José
;
Holmes Siedle, A.
;
García Inza, Mariano Andrés
;
Carbonetto, Sebastián Horacio
;
Redin, Eduardo Gabriel
;
Faigon, A.
(
Institute of Electrical and Electronics Engineers
,
2012-12
)
Artículo
Numerical modeling of radiation-induced charge neutralization in MOS devices
Sambuco Salomone, Lucas Ignacio
;
García Inza, Mariano Andrés
;
Carbonetto, Sebastián Horacio
;
Lipovetzky, José
;
Redin, Eduardo Gabriel
;
Faigon, Adrián Néstor
(
Pergamon-Elsevier Science Ltd
,
2022-04
)
Artículo
Radiation and bias switch-induced charge dynamics in Al2O3-based metal-oxide-semiconductor structures
Sambuco Salomone, Lucas Ignacio
;
Kasulin, A.
;
Lipovetzky, José
;
Carbonetto, Sebastián Horacio
;
García Inza, Mariano Andrés
;
Redin, Eduardo Gabriel
;
Berbeglia, F.
;
Campabadal, F.
;
Faigon, Adrián Néstor
(
American Institute of Physics
,
2014-11
)
Artículo
Reducing measurement uncertainties using bias cycled measurement in MOS dosimetry at different temperatures
Lipovetzky, José
;
Redin, Eduardo Gabriel
;
García Inza, Mariano Andrés
;
Carbonetto, Sebastián Horacio
;
Faigon, Adrián Néstor
(
Institute of Electrical and Electronics Engineers
,
2010-04
)
Artículo
Switched Bias Differential MOSFET Dosimeter
García Inza, Mariano Andrés
;
Carbonetto, Sebastián Horacio
;
Lipovetzky, José
;
Carra, Martin Javier
;
Sambuco Salomone, Lucas Ignacio
;
Redin, Eduardo Gabriel
;
Faigon, Adrián Néstor
(
Institute of Electrical and Electronics Engineers
,
2014-06
)
Artículo
Zero temperature coefficient bias in MOS devices. Dependence on interface traps density, application to MOS dosimetry
Carbonetto, Sebastián Horacio
;
García Inza, Mariano Andrés
;
Lipovetzky, José
;
Redin, Eduardo Gabriel
;
Sambuco Salomone, Lucas Ignacio
;
Faigon, Adrian Nestor
(
Institute of Electrical and Electronics Engineers
,
2011-09
)
Mostrando ítems 1-17 de 17