Artículo

Reducing measurement uncertainties using bias cycled measurement in MOS dosimetry at different temperatures

Lipovetzky, JoséIcon ; Redin, Eduardo Gabriel; García Inza, Mariano AndrésIcon ; Carbonetto, Sebastián HoracioIcon ; Faigon, Adrián NéstorIcon
Fecha de publicación: 04/2010
Editorial: Institute of Electrical and Electronics Engineers
Revista: Ieee Transactions on Nuclear Science
ISSN: 0018-9499
Idioma: Inglés
Tipo de recurso: Artículo publicado
Clasificación temática:

Resumen

Temperature dependence of MOS dosimeters response used under the Bias Controlled Cycled Measurement technique is investigated. The use of the biasing technique allows the compensation of temperature-induced changes in the response of the sensors, and reduces at least ten times the dose measurement error caused by undesired threshold voltage shifts.
Palabras clave: DOSIMETRY , MOS DEVICES , RADIATION EFFECTS , TEMPERATURE
 
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info:eu-repo/semantics/openAccess Excepto donde se diga explícitamente, este item se publica bajo la siguiente descripción: Creative Commons Attribution-NonCommercial-ShareAlike 2.5 Unported (CC BY-NC-SA 2.5)
Identificadores
URI: http://hdl.handle.net/11336/188517
URL: https://ieeexplore.ieee.org/document/5446505
DOI: http://dx.doi.org/10.1109/TNS.2010.2042178
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Citación
Lipovetzky, José; Redin, Eduardo Gabriel; García Inza, Mariano Andrés; Carbonetto, Sebastián Horacio; Faigon, Adrián Néstor; Reducing measurement uncertainties using bias cycled measurement in MOS dosimetry at different temperatures; Institute of Electrical and Electronics Engineers; Ieee Transactions on Nuclear Science; 57; 4-2010; 848-853
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