Acquisition of Phase-Contrast X-Ray Images With Commercial Off-the-Shelf CMOS Image Sensors

Abstract

This paper presents a system to obtain X-ray phase contrast images using a Commercial-Off-The-Shelf, low cost, CMOS Image Sensor as a direct radiation detector. The 5.2 μm pixel pitch allows the detection of Fresnel diffraction fringes, which enables the observation of borders and interfaces in samples. A simple experimental set-up comprised of a microfocus, tungsten anode, X-ray source, an image sensor, and the sample placed at tens of centimeters from the detector is used to measure Fresnel diffraction patterns in opaque and semi-transparent samples on semi-infinite planes. Additionally, two biological samples are presented as case studies. The sensor’s spectral resolution allows for a better understanding of the results.