Energy dispersive inelastic X-ray scattering (EDIXS) spectroscopy: A review

Abstract

This work presents an overview of a novel spectroscopic tool: Energy Dispersive Inelastic X-ray Scattering (EDIXS) spectroscopy. By the application of EDIXS, the local chemical environment of an element of interest can be characterized in a variety of experimental conditions. EDIXS makes use of core-level resonant inelastic X-ray scattering (RIXS), taking advantage of the benefits of an energy dispersive detection system and multivariate methods for the data analysis. As result, the proposed methodology presents a fast acquisition, energy-scanning free experiments, low self-absorption effects and an objective interpretation of the data. In this review a first section providing an introduction to the evolution of RIXS and the development of the EDIXS methodology is presented. After that, a theoretical frame from two different approaches is offered, presenting several aspects of the RIXS spectrum features and letting glimpse the origin of the peak fine structure, key issue of this technique. Next, an explanation of the different multivariate methods used for the data analysis is provided. By the end, a set of experimental results obtained with EDIXS are revised, including several irradiation geometries and setups (as total reflection, grazing incidence and even confocal) for a variety of samples. A brief summary with further discussions regarding the advantages of the presented methodology, including future perspectives as its applicability to different X-ray sources, are giving closure to the paper.