Fullerene-silicon polymerization evidence

Abstract

We report experimental results for C₆₀-Si deposition by simultaneous thermal vaporization of fullerene source and chemical vapor deposition from silane source. The samples were characterized by Scanning Electron Microscopy, Energy-dispersive X-ray spectroscopy, Micro-Raman spectroscopy, Wide-angle X-ray scattering, X-ray photoelectron spectroscopy and its thermal stability was studied, discussed and compared with pure C₆₀ deposited by the same method. A crystalline material was obtained and results suggest that a polymerization of fullerenes bridged by silicon atoms was achieved.