Temperature stable relative permittivity from −60 to 200 °C in 75BaTiO3–(25 − x)BiMg0.5Ti0.5O3–xNaNbO3 ceramics with X9R like characteristics

Abstract

75BaTiO3–(25 − x)BiMg0.5Ti0.5O3–xNaNbO3 (x = 0–0.2) ceramics were obtained by conventional solid-state reaction method. X-ray diffraction patterns of the samples showed the formation of cubic structure. No evidence of secondary phase was found within the detection limit of XRD facility which was in agreement with the Raman spectra of all the samples. Temperature dependence of relative permittivity and dielectric loss for the sample with x = 0.10 showed a temperature stable relative permittivity of ∼840 ± 15% over the temperature range −62 to 192 °C and dielectric losses <0.02 in a wide temperature range (−28 to 374 °C). The wide temperature stable dielectric properties of x = 0.10 sample suggest that it could be a promising candidate material for X8R/X9R type capacitors.