Evento

A new bi-imaging NDT system for simultaneous recovery of attenuation and electronic density maps

Tarpau, Cecilia ; Cebeiro, Javier Icon; Nguyen, Mai K.

Otros responsables

Fecha

2020

Editorial

Confédération Française pour les Essais Non Destructifs

Revista

Título del libro

Nombre del evento

11th International Symposium on Non-Destructive Testing and Evaluation in Aerospace

Fecha del evento

2019-11-19

Institución organizadora

Confédération Française pour les Essais Non Destructifs

ISSN

1435-4934

eISSN

ISBN

Idioma

Inglés

Tipo del evento

Simposio

Clasificación temática

Resumen

Computed Tomography is a widely used imaging technique for non-destructive testing and evaluation in industry. Tomographic modalities exploit only primary radiation, which is non-deviated but attenuated radiation going through matter. However, in the energy range of X and gamma rays used in non destructive testing, Compton effect is an important physical phenomenon which should be taken into account. Compton Scattering Tomography is precisely theimaging technique, which not only accounts for the Compton effect but also uses it to image material electronic density. This paper proposes the concept of a Compton scanner,which is formed by a source and several detectors placed on a circular ring. When the detectors are set to register the energy of primary photons, the system works as Fan-Beam computed tomography scanner. But if the detectors are set to register the energy of scattered photons, the system operates as Compton scattering tomography scanner. Such a device, that we called a bi-imaging system provides both the attenuation map and the electronic density of the scanned object. Both information from primary and scattered rays is then wisely exploited. The mathematical modelling of this system makes use of a Radon transform on circular arcs. Numerical simulations are carried out in order to illustrate the theoretical feasibility of the proposed system.

Aprobación

Revisión

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Licencia Creative Commons

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