Removal of Scattering Effects from EEM’s Using Independent Component Analysis – A Simulation Study

Abstract

Fluorescencespectroscopy is a well-established analytical technique, valued for its highsensitivity and ability to generate second-order data. When processedcorrectly, this data can be used to predict analyte concentrations withacceptable accuracy, even in the presence of unknown interferents. The presence of scattering(both Rayleigh and Raman) candramatically affect the quality of data modelling, particularly with regard to maintainingtrilinearity, a key requirement for obtaining reliable solutions using methodssuch as parallel factor analysis (PARAFAC). This study aims, even in its initial phase, to evaluate the use of IndependentComponent Analysis (ICA) for scattering correction in excitation-emissionmatrix (EEM) data.