Artículo

Direct measurement of the magnetic penetration depth by magnetic force microscopy

Kim, Jeehoon ; Civale, L. ; Nazaretski, E. ; Haberkorn, Nestor Fabian Icon; Ronning, F. ; Sefat, A. S. ; Tajima, T. ; Moeckly, B. H. ; Thompson, J. D. ; Movshovich, R.

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Fecha

09/2012

Editorial

IOP Publishing

Revista

Superconductor Science And Technology

Título del libro

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Institución organizadora

ISSN

0953-2048

eISSN

ISBN

Idioma

Inglés

Tipo del evento

Resumen

We present an experimental approach using magnetic force microscopy for measurements of the absolute value of the magnetic penetration depth (lambda) in superconductors. Lambda is obtained in a simple and robust way without introducing any tip modeling procedure via direct comparison of the Meissner response curves for a material of interest to those measured on a reference sample. Using a well characterized Nb film as a reference, we determine the absolute value of lambda in a Ba(Fe0.92Co0.08)2As2 single crystal and a MgB2 thin film through a comparative experiment. Our apparatus features simultaneous loading of multiple samples, and allows straightforward measurement of the absolute value of lambda in superconducting thin film or single crystal samples.

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