Reducing the formation of FIB‐induced FCC layers on Cu‐Zn‐Al austenite

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dc.conicet.fuenteindividual
dc.conicet.organizacionConsejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Patagonia Norte
dc.conicet.organizacionUniversiteit Antwerp
dc.conicet.organizacionUniversiteit Antwerp
dc.conicet.paisOrganizacionArgentina
dc.conicet.paisOrganizacionBélgica
dc.conicet.paisOrganizacionBélgica
dc.conicet.produccionid4455824
dc.contributor.authorZelaya, Maria Eugenia
dc.contributor.authorSchryvers, Dominique
dc.date.accessioned2026-02-03T14:25:48Z
dc.date.available2026-02-03T14:25:48Z
dc.date.issued2010-12
dc.date.updated2026-02-03T12:49:12Z
dc.description.abstractThe irradiation effects of thinning a sample of a Cu-Zn-Al shape memory alloy to electron transparency by a Ga+ focused ion beam were investigated. This thinning method was compared with conventional electropolishing and Ar+ ion milling. No implanted Ga was detected but surface FCC precipitation was found as a result of the focused ion beam sample preparation. Decreasing the irradiation dose by lowering the energy and current of the Ga+ ions did not lead to a complete disappearance of the FCC structure. The latter could only be removed after gentle Ar+ ion milling of the sample. It was further concluded that the precipitation of the FCC is independent of the crystallographic orientation of the surface.es
dc.description.filFil: Zelaya, Maria Eugenia. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Patagonia Norte; Argentina. Universiteit Antwerp; Bélgica
dc.description.filFil: Schryvers, Dominique. Universiteit Antwerp; Bélgica
dc.formatapplication/pdfes
dc.identifier.citationZelaya, Maria Eugenia; Schryvers, Dominique; Reducing the formation of FIB‐induced FCC layers on Cu‐Zn‐Al austenite; Wiley-liss, div John Wiley & Sons Inc.; Microscopy Research And Technique.; 74; 1; 12-2010; 84-91es
dc.identifier.institucionalCONICET
dc.identifier.issn1059-910Xes
dc.identifier.repoCONICET Digital
dc.identifier.urihttp://hdl.handle.net/11336/280936
dc.journal.ciudadNew Jerseyes
dc.journal.number1es
dc.journal.pagination84-91es
dc.journal.paisEstados Unidoses
dc.journal.titleMicroscopy Research And Technique.es
dc.journal.volume74es
dc.language.isoenges
dc.publisherWiley-liss, div John Wiley & Sons Inc.es
dc.relation.alternativeidinfo:eu-repo/semantics/altIdentifier/url/https://analyticalsciencejournals.onlinelibrary.wiley.com/doi/10.1002/jemt.20877
dc.relation.alternativeidinfo:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1002/jemt.20877
dc.rightsinfo:eu-repo/semantics/openAccess*
dc.rights.urihttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/*
dc.subjectFocused ion beames
dc.subjectTransmission electron microscopyes
dc.subjectIrradiation damagees
dc.subjectCu-Zn-Ales
dc.subjectShape memory alloyses
dc.subjectPhase transformationes
dc.subject.classificationOtras Ingeniería de los Materialeses
dc.subject.classificationIngeniería de los Materialeses
dc.subject.classificationINGENIERÍAS Y TECNOLOGÍASes
dc.titleReducing the formation of FIB‐induced FCC layers on Cu‐Zn‐Al austenitees
dc.typeinfo:eu-repo/semantics/article
dc.typeinfo:ar-repo/semantics/artículo
dc.typeinfo:eu-repo/semantics/publishedVersion

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