Artículo

Laminar length and characteristic relation in Type-I intermittency

del Rio, Ezequiel ; Elaskar, Sergio Amado Icon; Donoso, José

Otros responsables

Fecha

04/2014

Editorial

Elsevier Science

Revista

Communications In Nonlinear Science And Numerical Simulation

Título del libro

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Institución organizadora

ISSN

1007-5704

eISSN

ISBN

Idioma

Inglés

Tipo del evento

Clasificación temática

Resumen

A method to investigate systems showing Type-I intermittency phenomenon is presented. This method is an extension of the procedure we have recently established to study the Type-II and Type-III intermittencies. With this approach, new accurate analytical expressions for the reinjection and the laminar phase length probability densities are obtained. The new theoretical formulas are tested by numerical computation, showing an excellent agreement between analytical models and numerical results. In addition, our method fully generalizes the well-known classical characteristic relations, in such a way that it properly characterizes those systems showing Type-I intermittency.

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