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dc.contributor.author
Ghenzi, Néstor
dc.contributor.author
Levy, Pablo Eduardo
dc.date.available
2019-12-19T18:55:36Z
dc.date.issued
2018-06
dc.identifier.citation
Ghenzi, Néstor; Levy, Pablo Eduardo; Impact of sub- and supra- threshold switching in the synaptic behavior of TiO2 memristors; Elsevier Science; Microelectronic Engineering; 193; 6-2018; 13-17
dc.identifier.issn
0167-9317
dc.identifier.uri
http://hdl.handle.net/11336/92564
dc.description.abstract
Al/TiO2/Au memory junctions grown by reactive sputtering were fabricated and characterized. Usual hysteretic features were obtained, spanning an order of magnitude ratio between high and low resistance states. We explored sub-threshold and supra-threshold stimuli, to describe “binary” and “analogic” synapses (i.e. synaptic emulators) characteristics in detail. We show that each type of behavior can be chosen regarding the dependence of the switching on the amplitude of voltage stimuli. The sub-threshold switching originating the analog mode is explained by the drift-diffusion of oxygen vacancies while the binary mode is attributed to the Joule-heating-assisted electric-field-induced movement of oxygen vacancies. In the supra-threshold limit we found that “excitatory” and “inhibitory” synaptic behavior can be tailored by controlling the pulsing current amplitude. We discuss this result within the artificial neural network topology framework, as changing the behavior type of the synapses results in its reconfiguration.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
Elsevier Science
dc.rights
info:eu-repo/semantics/openAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
MEMORY
dc.subject
MEMRISTOR
dc.subject
OXIDE
dc.subject
RESISTIVE SWITCHING
dc.subject.classification
Física de los Materiales Condensados
dc.subject.classification
Ciencias Físicas
dc.subject.classification
CIENCIAS NATURALES Y EXACTAS
dc.title
Impact of sub- and supra- threshold switching in the synaptic behavior of TiO2 memristors
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2019-12-16T19:12:55Z
dc.journal.volume
193
dc.journal.pagination
13-17
dc.journal.pais
Países Bajos
dc.journal.ciudad
Amsterdam
dc.description.fil
Fil: Ghenzi, Néstor. Comisión Nacional de Energía Atómica; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
dc.description.fil
Fil: Levy, Pablo Eduardo. Comisión Nacional de Energía Atómica; Argentina. Universidad Nacional de San Martín. Escuela de Ciencia y Tecnología; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
dc.journal.title
Microelectronic Engineering
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://linkinghub.elsevier.com/retrieve/pii/S0167931718300844
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1016/j.mee.2018.02.017
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