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dc.contributor.author
Ghenzi, Néstor  
dc.contributor.author
Levy, Pablo Eduardo  
dc.date.available
2019-12-19T18:55:36Z  
dc.date.issued
2018-06  
dc.identifier.citation
Ghenzi, Néstor; Levy, Pablo Eduardo; Impact of sub- and supra- threshold switching in the synaptic behavior of TiO2 memristors; Elsevier Science; Microelectronic Engineering; 193; 6-2018; 13-17  
dc.identifier.issn
0167-9317  
dc.identifier.uri
http://hdl.handle.net/11336/92564  
dc.description.abstract
Al/TiO2/Au memory junctions grown by reactive sputtering were fabricated and characterized. Usual hysteretic features were obtained, spanning an order of magnitude ratio between high and low resistance states. We explored sub-threshold and supra-threshold stimuli, to describe “binary” and “analogic” synapses (i.e. synaptic emulators) characteristics in detail. We show that each type of behavior can be chosen regarding the dependence of the switching on the amplitude of voltage stimuli. The sub-threshold switching originating the analog mode is explained by the drift-diffusion of oxygen vacancies while the binary mode is attributed to the Joule-heating-assisted electric-field-induced movement of oxygen vacancies. In the supra-threshold limit we found that “excitatory” and “inhibitory” synaptic behavior can be tailored by controlling the pulsing current amplitude. We discuss this result within the artificial neural network topology framework, as changing the behavior type of the synapses results in its reconfiguration.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
Elsevier Science  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
MEMORY  
dc.subject
MEMRISTOR  
dc.subject
OXIDE  
dc.subject
RESISTIVE SWITCHING  
dc.subject.classification
Física de los Materiales Condensados  
dc.subject.classification
Ciencias Físicas  
dc.subject.classification
CIENCIAS NATURALES Y EXACTAS  
dc.title
Impact of sub- and supra- threshold switching in the synaptic behavior of TiO2 memristors  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2019-12-16T19:12:55Z  
dc.journal.volume
193  
dc.journal.pagination
13-17  
dc.journal.pais
Países Bajos  
dc.journal.ciudad
Amsterdam  
dc.description.fil
Fil: Ghenzi, Néstor. Comisión Nacional de Energía Atómica; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: Levy, Pablo Eduardo. Comisión Nacional de Energía Atómica; Argentina. Universidad Nacional de San Martín. Escuela de Ciencia y Tecnología; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.journal.title
Microelectronic Engineering  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://linkinghub.elsevier.com/retrieve/pii/S0167931718300844  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1016/j.mee.2018.02.017