Artículo
A novel approach for measuring nanometric displacements by correlating speckle interferograms
Fecha de publicación:
11/2018
Editorial:
Elsevier
Revista:
Optics And Lasers In Engineering
ISSN:
0143-8166
Idioma:
Inglés
Tipo de recurso:
Artículo publicado
Clasificación temática:
Resumen
Recently, two phase evaluation methods were proposed to measure nanometric displacements by means of digital speckle pattern interferometry when the phase changes introduced by the deformation are in the range [0, π) rad. However, one of these techniques requires separate recording of the intensities of the object and the reference beams which correspond to both the initial and the deformed interferograms. The other technique only works to measure out-of-plane displacements. In this paper, we present a novel approach that overcomes these limitations. The performance of the proposed method is analyzed using computer-simulated speckle interferograms and it is also compared with the results obtained with a phase-shifting technique. Finally, an application of the proposed phase method used to process experimental data is illustrated.
Archivos asociados
Licencia
Identificadores
Colecciones
Articulos(IFIR)
Articulos de INST.DE FISICA DE ROSARIO (I)
Articulos de INST.DE FISICA DE ROSARIO (I)
Citación
Tendela, Lucas Pedro; Galizzi, Gustavo Ernesto; A novel approach for measuring nanometric displacements by correlating speckle interferograms; Elsevier; Optics And Lasers In Engineering; 110; 11-2018; 149-154
Compartir
Altmétricas