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dc.contributor.author
Izraelevitch, Federico Hernán
dc.contributor.author
Amidei, D.
dc.contributor.author
Aprahamian, A.
dc.contributor.author
Arcos Olalla, R.
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Cancelo, Gustavo Indalecio Eugenio
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Casarella, C.
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Chavarria, A. E.
dc.contributor.author
Collon, P.
dc.contributor.author
Estrada, Juan
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Fernández Moroni, Guillermo
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Guardincerri, Yann
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Gutiérrez, G.
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Gyurjinyan, A.
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Kavner, A.
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Kilminster, B.
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Liao, J.
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Liu, Q.
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López, M.
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Molina, J.
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Privitera, P.
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Reyes, M. A.
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Scarpine, V.
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Siegl, K.
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Smith, M.
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Strauss, S.
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Tan, W.
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Tiffenberg, Javier Sebastian
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Villanueva, L.
dc.date.available
2019-03-28T15:48:12Z
dc.date.issued
2017-06
dc.identifier.citation
Izraelevitch, Federico Hernán; Amidei, D.; Aprahamian, A.; Arcos Olalla, R.; Cancelo, Gustavo Indalecio Eugenio; et al.; A measurement of the ionization efficiency of nuclear recoils in silicon; IOP Publishing; Journal of Instrumentation; 12; 6; 6-2017; 1-16
dc.identifier.issn
1748-0221
dc.identifier.uri
http://hdl.handle.net/11336/72744
dc.description.abstract
We have measured the ionization efficiency of silicon nuclear recoils with kinetic energy between 1.8 and 20 keV. We bombarded a silicon-drift diode with a neutron beam to perform an elastic-scattering experiment. A broad-energy neutron spectrum was used and the nuclear recoil energy was reconstructed using a measurement of the time of flight and scattering angle of the scattered neutron. The overall trend of the results of this work is well described by the theory of Lindhard et al. above 4 keV of recoil energy. Below this energy, the presented data shows a deviation from the model. The data indicates a faster drop than the theory prediction at low energies.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
IOP Publishing
dc.rights
info:eu-repo/semantics/openAccess
dc.rights.uri
https://creativecommons.org/licenses/by/2.5/ar/
dc.subject
Dark Matter Detectors (Wimps, Axions, Etc.)
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Instrumentation And Methods for Time-Of-Flight (Tof) Spectroscopy
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Neutron Detectors (Cold, Thermal, Fast Neutrons)
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Solid State Detectors
dc.subject.classification
Astronomía
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Ciencias Físicas
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CIENCIAS NATURALES Y EXACTAS
dc.title
A measurement of the ionization efficiency of nuclear recoils in silicon
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2019-03-26T13:56:17Z
dc.journal.volume
12
dc.journal.number
6
dc.journal.pagination
1-16
dc.journal.pais
Reino Unido
dc.journal.ciudad
Londres
dc.description.fil
Fil: Izraelevitch, Federico Hernán. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Departamento de Física; Argentina. Fermi National Accelerator Laboratory; Estados Unidos
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Fil: Amidei, D.. University of Michigan; Estados Unidos
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Fil: Aprahamian, A.. University of Notre Dame; Estados Unidos
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Fil: Arcos Olalla, R.. Universidad de Guanajuato; México
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Fil: Cancelo, Gustavo Indalecio Eugenio. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Fermi National Accelerator Laboratory; Estados Unidos
dc.description.fil
Fil: Casarella, C.. University of Notre Dame; Estados Unidos
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Fil: Chavarria, A. E.. University of Chicago; Estados Unidos
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Fil: Collon, P.. University of Notre Dame; Estados Unidos
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Fil: Estrada, Juan. Fermi National Accelerator Laboratory; Estados Unidos
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Fil: Fernández Moroni, Guillermo. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Fermi National Accelerator Laboratory; Estados Unidos
dc.description.fil
Fil: Guardincerri, Yann. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Fermi National Accelerator Laboratory; Estados Unidos
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Fil: Gutiérrez, G.. Fermi National Accelerator Laboratory; Estados Unidos
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Fil: Gyurjinyan, A.. University of Notre Dame; Estados Unidos
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Fil: Kavner, A.. University of Michigan; Estados Unidos
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Fil: Kilminster, B.. Universitat Zurich; Suiza
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Fil: Liao, J.. Universitat Zurich; Suiza
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Fil: Liu, Q.. University of Notre Dame; Estados Unidos
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Fil: López, M.. Universidad Nacional de Asunción; Paraguay
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Fil: Molina, J.. Universidad Nacional de Asunción; Paraguay
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Fil: Privitera, P.. University of Chicago; Estados Unidos
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Fil: Reyes, M. A.. Universidad de Guanajuato; México
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Fil: Scarpine, V.. Fermi National Accelerator Laboratory; Estados Unidos
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Fil: Siegl, K.. University of Notre Dame; Estados Unidos
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Fil: Smith, M.. University of Notre Dame; Estados Unidos
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Fil: Strauss, S.. University of Notre Dame; Estados Unidos
dc.description.fil
Fil: Tan, W.. University of Notre Dame; Estados Unidos
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Fil: Tiffenberg, Javier Sebastian. Fermi National Accelerator Laboratory; Estados Unidos. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
dc.description.fil
Fil: Villanueva, L.. Universidad de Guanajuato; México
dc.journal.title
Journal of Instrumentation
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://iopscience.iop.org/article/10.1088/1748-0221/12/06/P06014/meta
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/https://doi.org/10.1088/1748-0221/12/06/P06014
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://arxiv.org/abs/1702.00873
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