Artículo

A measurement of the ionization efficiency of nuclear recoils in silicon

Izraelevitch, Federico HernánIcon ; Amidei, D.; Aprahamian, A.; Arcos Olalla, R.; Cancelo, Gustavo Indalecio EugenioIcon ; Casarella, C.; Chavarria, A. E.; Collon, P.; Estrada, Juan; Fernández Moroni, GuillermoIcon ; Guardincerri, YannIcon ; Gutiérrez, G.; Gyurjinyan, A.; Kavner, A.; Kilminster, B.; Liao, J.; Liu, Q.; López, M.; Molina, J.; Privitera, P.; Reyes, M. A.; Scarpine, V.; Siegl, K.; Smith, M.; Strauss, S.; Tan, W.; Tiffenberg, Javier SebastianIcon ; Villanueva, L.
Fecha de publicación: 06/2017
Editorial: IOP Publishing
Revista: Journal of Instrumentation
ISSN: 1748-0221
Idioma: Inglés
Tipo de recurso: Artículo publicado
Clasificación temática:

Resumen

We have measured the ionization efficiency of silicon nuclear recoils with kinetic energy between 1.8 and 20 keV. We bombarded a silicon-drift diode with a neutron beam to perform an elastic-scattering experiment. A broad-energy neutron spectrum was used and the nuclear recoil energy was reconstructed using a measurement of the time of flight and scattering angle of the scattered neutron. The overall trend of the results of this work is well described by the theory of Lindhard et al. above 4 keV of recoil energy. Below this energy, the presented data shows a deviation from the model. The data indicates a faster drop than the theory prediction at low energies.
Palabras clave: Dark Matter Detectors (Wimps, Axions, Etc.) , Instrumentation And Methods for Time-Of-Flight (Tof) Spectroscopy , Neutron Detectors (Cold, Thermal, Fast Neutrons) , Solid State Detectors
 
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info:eu-repo/semantics/openAccess Excepto donde se diga explícitamente, este item se publica bajo la siguiente descripción: Creative Commons Attribution 2.5 Unported (CC BY 2.5)
Identificadores
URI: http://hdl.handle.net/11336/72744
URL: http://iopscience.iop.org/article/10.1088/1748-0221/12/06/P06014/meta
DOI: https://doi.org/10.1088/1748-0221/12/06/P06014
URL: https://arxiv.org/abs/1702.00873
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Articulos(SEDE CENTRAL)
Articulos de SEDE CENTRAL
Citación
Izraelevitch, Federico Hernán; Amidei, D.; Aprahamian, A.; Arcos Olalla, R.; Cancelo, Gustavo Indalecio Eugenio; et al.; A measurement of the ionization efficiency of nuclear recoils in silicon; IOP Publishing; Journal of Instrumentation; 12; 6; 6-2017; 1-16
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