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dc.contributor.author
Castellano, Gustavo Eugenio  
dc.contributor.author
Bonetto, Rita Dominga  
dc.contributor.author
Trincavelli, Jorge Carlos  
dc.contributor.author
Vasconcellos, M.  
dc.contributor.author
Campos, C.  
dc.date.available
2018-10-17T17:47:40Z  
dc.date.issued
2002-03  
dc.identifier.citation
Castellano, Gustavo Eugenio; Bonetto, Rita Dominga; Trincavelli, Jorge Carlos; Vasconcellos, M.; Campos, C.; Optimization of K-shell intensity ratios in electron probe microanalysis; John Wiley & Sons Ltd; X-ray Spectrometry; 31; 2; 3-2002; 184-187  
dc.identifier.issn
0049-8246  
dc.identifier.uri
http://hdl.handle.net/11336/62583  
dc.description.abstract
A method for refinement of atomic and experimental parameters was applied to the optimization of K-shell intensity ratios in electron probe microanalysis (EPMA). This kind of procedure, previously used in x-ray diffraction, is shown to be a powerful tool in EPMA. The method consists of minimizing the differences between an experimental x-ray spectrum and a function proposed to account for the bremsstrahlung and characteristic peaks from the corresponding sample, and also for detection artifacts. In this work, the method was used for the determination of transition rates. This procedure was applied to 14 elements with atomic numbers ranging from 20 to 42. The results obtained are in agreement with theoretical and experimental data for Kα/(Kβ + Kα) intensity ratios. In addition, Kα1, Kα2, Kβ1, and Kβ2 relative intensities were compared with experimental data, showing a similar behaviour. Copyright © 2002 John Wiley & Sons, Ltd.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
John Wiley & Sons Ltd  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject.classification
Astronomía  
dc.subject.classification
Ciencias Físicas  
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CIENCIAS NATURALES Y EXACTAS  
dc.title
Optimization of K-shell intensity ratios in electron probe microanalysis  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2018-10-12T18:07:11Z  
dc.journal.volume
31  
dc.journal.number
2  
dc.journal.pagination
184-187  
dc.journal.pais
Reino Unido  
dc.journal.ciudad
Londres  
dc.description.fil
Fil: Castellano, Gustavo Eugenio. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía y Física; Argentina  
dc.description.fil
Fil: Bonetto, Rita Dominga. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Centro de Investigación y Desarrollo en Ciencias Aplicadas "Dr. Jorge J. Ronco". Universidad Nacional de la Plata. Facultad de Ciencias Exactas. Centro de Investigación y Desarrollo en Ciencias Aplicadas; Argentina  
dc.description.fil
Fil: Trincavelli, Jorge Carlos. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía y Física; Argentina  
dc.description.fil
Fil: Vasconcellos, M.. Universidade Federal do Rio Grande do Sul; Brasil  
dc.description.fil
Fil: Campos, C.. Universidade Federal do Rio Grande do Sul; Brasil  
dc.journal.title
X-ray Spectrometry  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/https://dx.doi.org/10.1002/xrs.566  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://onlinelibrary.wiley.com/doi/abs/10.1002/xrs.566