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dc.contributor.author
Castellano, Gustavo Eugenio
dc.contributor.author
Bonetto, Rita Dominga
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Trincavelli, Jorge Carlos
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Vasconcellos, M.
dc.contributor.author
Campos, C.
dc.date.available
2018-10-17T17:47:40Z
dc.date.issued
2002-03
dc.identifier.citation
Castellano, Gustavo Eugenio; Bonetto, Rita Dominga; Trincavelli, Jorge Carlos; Vasconcellos, M.; Campos, C.; Optimization of K-shell intensity ratios in electron probe microanalysis; John Wiley & Sons Ltd; X-ray Spectrometry; 31; 2; 3-2002; 184-187
dc.identifier.issn
0049-8246
dc.identifier.uri
http://hdl.handle.net/11336/62583
dc.description.abstract
A method for refinement of atomic and experimental parameters was applied to the optimization of K-shell intensity ratios in electron probe microanalysis (EPMA). This kind of procedure, previously used in x-ray diffraction, is shown to be a powerful tool in EPMA. The method consists of minimizing the differences between an experimental x-ray spectrum and a function proposed to account for the bremsstrahlung and characteristic peaks from the corresponding sample, and also for detection artifacts. In this work, the method was used for the determination of transition rates. This procedure was applied to 14 elements with atomic numbers ranging from 20 to 42. The results obtained are in agreement with theoretical and experimental data for Kα/(Kβ + Kα) intensity ratios. In addition, Kα1, Kα2, Kβ1, and Kβ2 relative intensities were compared with experimental data, showing a similar behaviour. Copyright © 2002 John Wiley & Sons, Ltd.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
John Wiley & Sons Ltd
dc.rights
info:eu-repo/semantics/restrictedAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject.classification
Astronomía
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Ciencias Físicas
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CIENCIAS NATURALES Y EXACTAS
dc.title
Optimization of K-shell intensity ratios in electron probe microanalysis
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2018-10-12T18:07:11Z
dc.journal.volume
31
dc.journal.number
2
dc.journal.pagination
184-187
dc.journal.pais
Reino Unido
dc.journal.ciudad
Londres
dc.description.fil
Fil: Castellano, Gustavo Eugenio. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía y Física; Argentina
dc.description.fil
Fil: Bonetto, Rita Dominga. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Centro de Investigación y Desarrollo en Ciencias Aplicadas "Dr. Jorge J. Ronco". Universidad Nacional de la Plata. Facultad de Ciencias Exactas. Centro de Investigación y Desarrollo en Ciencias Aplicadas; Argentina
dc.description.fil
Fil: Trincavelli, Jorge Carlos. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía y Física; Argentina
dc.description.fil
Fil: Vasconcellos, M.. Universidade Federal do Rio Grande do Sul; Brasil
dc.description.fil
Fil: Campos, C.. Universidade Federal do Rio Grande do Sul; Brasil
dc.journal.title
X-ray Spectrometry
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/https://dx.doi.org/10.1002/xrs.566
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://onlinelibrary.wiley.com/doi/abs/10.1002/xrs.566


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