Artículo
Resistance switching and formation of a conductive bridge in metal/binary oxide/metal structure for memory devices
Fecha de publicación:
12/2008
Editorial:
Japan Society Applied Physics
Revista:
Japanese Journal Of Applied Physics
ISSN:
0021-4922
Idioma:
Inglés
Tipo de recurso:
Artículo publicado
Clasificación temática:
Resumen
The resistance switching mechanism of a metal/CuO/metal sandwich with a planar device structure has been studied. We report the direct observation of a conducting bridge within the CuO channel of the device, which is formed upon the initial voltage application (forming process). It is found that the resistance switching phenomenon only occurs when just a single bridge is formed during a soft dielectric breakdown. We argue that the reduction and oxidation of this conducting bridge by the action of an applied field and/or current gives rise to a novel nonvolatile memory effect. © 2008 The Japan Society of Applied Physics.
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Identificadores
Colecciones
Articulos(IFIBA)
Articulos de INST.DE FISICA DE BUENOS AIRES
Articulos de INST.DE FISICA DE BUENOS AIRES
Citación
Fujiwara, Kohei; Nemoto, Takumi; Rozenberg, Marcelo Javier; Nakamura, Yoshinobu; Takagi, Hidenori; Resistance switching and formation of a conductive bridge in metal/binary oxide/metal structure for memory devices; Japan Society Applied Physics; Japanese Journal Of Applied Physics; 47; 8 PART 1; 12-2008; 6266-6271
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