Artículo
Study of the oxygen vacancies changes in SnO2 polycrystalline thick films using impedance and photoemission spectroscopies
Schipani, Federico; Ponce, Miguel Adolfo
; Joanni, Ednan; Williams, Federico Jose
; Aldao, Celso Manuel
Fecha de publicación:
18/11/2014
Editorial:
American Institute Of Physics
Revista:
Journal Of Applied Physics
ISSN:
0021-8979
Idioma:
Inglés
Tipo de recurso:
Artículo publicado
Clasificación temática:
Resumen
Changes in the concentration of oxygen vacancies within the grains of polycrystalline SnO2, due to different atmosphere exposures, were detected using impedance and photoemission spectroscopies. From measured capacitance values, variations of the potential barrier widths could be determined. It is shown that under the presence of an oxygen rich atmosphere, at relatively low temperature, the width of intergranular potential barriers increase to the point that grains become completely depleted of carriers. With subsequent exposure to vacuum, capacitance adopts a higher value, indicative of intergranular barriers and quasi-neutral regions at the center of the grains. X-ray and ultraviolet photoemission spectroscopy measurements showed that SnO2 samples treated in oxidizing or reducing environments have similar barrier heights and different work functions. Results are especially relevant in the study of mechanisms responsible for metal oxide gas sensing
Palabras clave:
Sensors
,
Oxygen Vacancie Diffusion
,
Capacitance
,
Xps
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Articulos(CCT - MAR DEL PLATA)
Articulos de CTRO.CIENTIFICO TECNOL.CONICET - MAR DEL PLATA
Articulos de CTRO.CIENTIFICO TECNOL.CONICET - MAR DEL PLATA
Articulos(INQUIMAE)
Articulos de INST.D/QUIM FIS D/L MATERIALES MEDIOAMB Y ENERGIA
Articulos de INST.D/QUIM FIS D/L MATERIALES MEDIOAMB Y ENERGIA
Articulos(INTEMA)
Articulos de INST.DE INV.EN CIENCIA Y TECNOL.MATERIALES (I)
Articulos de INST.DE INV.EN CIENCIA Y TECNOL.MATERIALES (I)
Citación
Schipani, Federico; Ponce, Miguel Adolfo; Joanni, Ednan; Williams, Federico Jose; Aldao, Celso Manuel; Study of the oxygen vacancies changes in SnO2 polycrystalline thick films using impedance and photoemission spectroscopies; American Institute Of Physics; Journal Of Applied Physics; 116; 19; 18-11-2014; 194502-194502
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