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dc.contributor.author
Orallo, Carlos Martin
dc.contributor.author
Carugati, Ignacio
dc.contributor.author
Donato, Patricio Gabriel
dc.contributor.author
Maestri, Sebastian Oscar
dc.date.available
2018-06-29T17:57:48Z
dc.date.issued
2015-06
dc.identifier.citation
Orallo, Carlos Martin; Carugati, Ignacio; Donato, Patricio Gabriel; Maestri, Sebastian Oscar; Study on Single-bin Sliding DFT algorithms: Comparison, stability issues and frequency adaptivity; Elsevier; Measurement; 69; 6-2015; 9-19
dc.identifier.issn
0263-2241
dc.identifier.uri
http://hdl.handle.net/11336/50723
dc.description.abstract
The standard method for spectrum analysis is the Discrete Fourier Transform(DFT), typically implemented using a Fast Fourier Transform (FFT) algorithm. However, certain applications require an on-line spectrum analysis only on a subset of M frequencies of an N-point DFT ðM < NÞ. In such cases, the use of Single-bin Sliding DFT (Sb-SDFT) is preferred over the direct application of FFT. Along these lines, the most popular algorithms are the Sliding Discrete Fourier Transform (SDFT), the Sliding Goertzel Transform (SGT), the Modulated Sliding Discrete Fourier Transform (mSDFT), and the S. Douglas and J. Soh algorithm (D&S). Even though these methods seem to differ, they are derived from the conventional DFT using distinct approaches and properties. To better understand the advantages, limitations and similarities each of them have, this work thoroughly evaluates and compares the four Sb-SDFT methods. What is more, the direct application of these Sb-SDFTs may lead to inaccuracies due to spectral leakage and picket-fence effects, common pitfalls inherited by every DFT-based method. For this reason, a unified model of the Sb-SDFT methods is proposed, whose aim is to design a frequency adaptive control loop. This frequency adaptability allows to mitigate the problems associated with improper sampling frequency. By using this unified model, the election of the Sb-SDFT algorithm is independent of the controller design and all the methods are equivalent. Theoretical results are validated by simulations and a DSP implementation of the four frequency adaptive Single-bin Sliding DFT methods.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
Elsevier
dc.rights
info:eu-repo/semantics/openAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-nd/2.5/ar/
dc.subject
Control Design
dc.subject
Digital Signal Processing
dc.subject
Discrete
dc.subject
Fourier Transform
dc.subject
Harmonics Measurement
dc.subject
Power Quality
dc.subject
System Modeling
dc.subject.classification
Ingeniería de Sistemas y Comunicaciones
dc.subject.classification
Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información
dc.subject.classification
INGENIERÍAS Y TECNOLOGÍAS
dc.title
Study on Single-bin Sliding DFT algorithms: Comparison, stability issues and frequency adaptivity
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2018-06-29T13:09:12Z
dc.journal.volume
69
dc.journal.pagination
9-19
dc.journal.pais
Países Bajos
dc.journal.ciudad
Amsterdam
dc.description.fil
Fil: Orallo, Carlos Martin. Universidad Nacional de Mar del Plata. Facultad de Ingeniería. Departamento de Electrónica. Laboratorio de Instrumentación y Control; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
dc.description.fil
Fil: Carugati, Ignacio. Universidad Nacional de Mar del Plata. Facultad de Ingeniería. Departamento de Electrónica. Laboratorio de Instrumentación y Control; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
dc.description.fil
Fil: Donato, Patricio Gabriel. Universidad Nacional de Mar del Plata. Facultad de Ingeniería. Departamento de Electrónica. Laboratorio de Instrumentación y Control; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
dc.description.fil
Fil: Maestri, Sebastian Oscar. Universidad Nacional de Mar del Plata. Facultad de Ingeniería. Departamento de Electrónica. Laboratorio de Instrumentación y Control; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
dc.journal.title
Measurement
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1016/j.measurement.2015.03.011
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://www.sciencedirect.com/science/article/pii/S0263224115001530
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