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dc.contributor.author
Orallo, Carlos Martin  
dc.contributor.author
Carugati, Ignacio  
dc.contributor.author
Donato, Patricio Gabriel  
dc.contributor.author
Maestri, Sebastian Oscar  
dc.date.available
2018-06-29T17:57:48Z  
dc.date.issued
2015-06  
dc.identifier.citation
Orallo, Carlos Martin; Carugati, Ignacio; Donato, Patricio Gabriel; Maestri, Sebastian Oscar; Study on Single-bin Sliding DFT algorithms: Comparison, stability issues and frequency adaptivity; Elsevier; Measurement; 69; 6-2015; 9-19  
dc.identifier.issn
0263-2241  
dc.identifier.uri
http://hdl.handle.net/11336/50723  
dc.description.abstract
The standard method for spectrum analysis is the Discrete Fourier Transform(DFT), typically implemented using a Fast Fourier Transform (FFT) algorithm. However, certain applications require an on-line spectrum analysis only on a subset of M frequencies of an N-point DFT ðM < NÞ. In such cases, the use of Single-bin Sliding DFT (Sb-SDFT) is preferred over the direct application of FFT. Along these lines, the most popular algorithms are the Sliding Discrete Fourier Transform (SDFT), the Sliding Goertzel Transform (SGT), the Modulated Sliding Discrete Fourier Transform (mSDFT), and the S. Douglas and J. Soh algorithm (D&S). Even though these methods seem to differ, they are derived from the conventional DFT using distinct approaches and properties. To better understand the advantages, limitations and similarities each of them have, this work thoroughly evaluates and compares the four Sb-SDFT methods. What is more, the direct application of these Sb-SDFTs may lead to inaccuracies due to spectral leakage and picket-fence effects, common pitfalls inherited by every DFT-based method. For this reason, a unified model of the Sb-SDFT methods is proposed, whose aim is to design a frequency adaptive control loop. This frequency adaptability allows to mitigate the problems associated with improper sampling frequency. By using this unified model, the election of the Sb-SDFT algorithm is independent of the controller design and all the methods are equivalent. Theoretical results are validated by simulations and a DSP implementation of the four frequency adaptive Single-bin Sliding DFT methods.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
Elsevier  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-nd/2.5/ar/  
dc.subject
Control Design  
dc.subject
Digital Signal Processing  
dc.subject
Discrete  
dc.subject
Fourier Transform  
dc.subject
Harmonics Measurement  
dc.subject
Power Quality  
dc.subject
System Modeling  
dc.subject.classification
Ingeniería de Sistemas y Comunicaciones  
dc.subject.classification
Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información  
dc.subject.classification
INGENIERÍAS Y TECNOLOGÍAS  
dc.title
Study on Single-bin Sliding DFT algorithms: Comparison, stability issues and frequency adaptivity  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2018-06-29T13:09:12Z  
dc.journal.volume
69  
dc.journal.pagination
9-19  
dc.journal.pais
Países Bajos  
dc.journal.ciudad
Amsterdam  
dc.description.fil
Fil: Orallo, Carlos Martin. Universidad Nacional de Mar del Plata. Facultad de Ingeniería. Departamento de Electrónica. Laboratorio de Instrumentación y Control; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: Carugati, Ignacio. Universidad Nacional de Mar del Plata. Facultad de Ingeniería. Departamento de Electrónica. Laboratorio de Instrumentación y Control; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: Donato, Patricio Gabriel. Universidad Nacional de Mar del Plata. Facultad de Ingeniería. Departamento de Electrónica. Laboratorio de Instrumentación y Control; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: Maestri, Sebastian Oscar. Universidad Nacional de Mar del Plata. Facultad de Ingeniería. Departamento de Electrónica. Laboratorio de Instrumentación y Control; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.journal.title
Measurement  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1016/j.measurement.2015.03.011  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://www.sciencedirect.com/science/article/pii/S0263224115001530