Quantification and characterization of Si in Pinus Insignis Dougl by TXRF

Abstract

A simple quantification of silicon is described, in woods such as Pinus Insigne Dougl obtained from the 8th region of Bío-Bío, 37°15″ South-73°19″ West, Chile. The samples were prepared through fractional calcination, and the ashes were directly analyzed by total reflection X-ray fluorescence (TXRF) technique. The analysis of 16 samples that were calcined is presented. The samples were weighed on plastic reflectors in a microbalance with sensitivity of 0.1 µg. Later, the samples were irradiated in a TXRF PICOFOX spectrometer, for 350 and 700 s. To each sample, cobalt was added as an internal standard. Concentrations of silicon over the 1 % in each sample and the self-absorption effect on the quantification were observed, in masses higher than 100 μg.