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dc.contributor.author
Pagano, R.
dc.contributor.author
Lombardo, S.
dc.contributor.author
Palumbo, Félix Roberto Mario
dc.contributor.author
Sanfilippo, D.
dc.contributor.author
Valvo, G.
dc.contributor.author
Fallica, G.
dc.contributor.author
Libertino, S.
dc.date.available
2018-02-07T13:09:23Z
dc.date.issued
2014-09
dc.identifier.citation
Pagano, R.; Lombardo, S.; Palumbo, Félix Roberto Mario; Sanfilippo, D.; Valvo, G. ; et al.; Radiation hardness of silicon Photomultipliers under 60Co γ-ray irradiation; Elsevier Science; Nuclear Instruments And Methods In Physics Research A: Accelerators, Spectrometers, Detectors And Associated Equipament; 767; 9-2014; 347-352
dc.identifier.issn
0168-9002
dc.identifier.uri
http://hdl.handle.net/11336/35926
dc.description.abstract
Radiation damage in silicon photomultipliers (SiPM) caused by exposure to 60Co γ-rays is experimentally evaluated and discussed. SiPM devices were irradiated to doses up to 9.4 kGy. Dark current, dark count rate, gain, single photon counting capability, and cross-talk probability among SiPM pixels are evaluated as a function of irradiation dose.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
Elsevier Science
dc.rights
info:eu-repo/semantics/openAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
Silicon Photomultiplier
dc.subject
Radiation Damage
dc.subject
Radiation Hardness
dc.subject
Gamma Rays
dc.subject.classification
Astronomía
dc.subject.classification
Ciencias Físicas
dc.subject.classification
CIENCIAS NATURALES Y EXACTAS
dc.title
Radiation hardness of silicon Photomultipliers under 60Co γ-ray irradiation
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2018-02-06T20:06:34Z
dc.journal.volume
767
dc.journal.pagination
347-352
dc.journal.pais
Países Bajos
dc.journal.ciudad
Amsterdam
dc.description.fil
Fil: Pagano, R.. Istituto per la Microelettronica e Microsistemi. Catania; Italia
dc.description.fil
Fil: Lombardo, S.. Istituto per la Microelettronica e Microsistemi. Catania; Italia
dc.description.fil
Fil: Palumbo, Félix Roberto Mario. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Technion - Israel Institute of Technology; Israel
dc.description.fil
Fil: Sanfilippo, D.. STMicroelectronics. Catania; Italia
dc.description.fil
Fil: Valvo, G.. STMicroelectronics. Catania; Italia
dc.description.fil
Fil: Fallica, G.. STMicroelectronics. Catania; Italia
dc.description.fil
Fil: Libertino, S.. Istituto per la Microelettronica e Microsistemi. Catania; Italia
dc.journal.title
Nuclear Instruments And Methods In Physics Research A: Accelerators, Spectrometers, Detectors And Associated Equipament
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1016/j.nima.2014.08.028
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://www.sciencedirect.com/science/article/pii/S0168900214009577
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