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dc.contributor.author
Sonnaillon, Maximiliano Osvaldo  
dc.contributor.author
Urteaga, Raul  
dc.contributor.author
Bonetto, Fabian Jose  
dc.date.available
2017-10-02T18:11:03Z  
dc.date.issued
2008-12  
dc.identifier.citation
Sonnaillon, Maximiliano Osvaldo; Urteaga, Raul; Bonetto, Fabian Jose; High-frequency Digital Lock-in Amplifier Using Random Sampling; Institute of Electrical and Electronics Engineers; Ieee Transactions On Instrumentation And Measurement; 57; 3; 12-2008; 616-621  
dc.identifier.issn
0018-9456  
dc.identifier.uri
http://hdl.handle.net/11336/25596  
dc.description.abstract
A high-frequency digital lock-in amplifier (LIA) that uses a random-sampling scheme is proposed and tested experimentally in this paper. By using this sampling strategy, it is possible to process, without aliasing effects, periodic signals of frequencies that are several times higher than the Nyquist frequency. Analytical and numerical analyses that show the advantages and limitations of the proposed scheme are presented. A high-frequency digital LIA implementation is also described. The prototype maximum sampling frequency is 150 kHz, and its maximum signal frequency without aliasing is 2.5 MHz, limited only by the random-sampling period quantization. Experimental results that validate the proposal are presented.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
Institute of Electrical and Electronics Engineers  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
Random  
dc.subject
Sampling  
dc.subject.classification
Ingeniería Mecánica  
dc.subject.classification
Ingeniería Mecánica  
dc.subject.classification
INGENIERÍAS Y TECNOLOGÍAS  
dc.title
High-frequency Digital Lock-in Amplifier Using Random Sampling  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2017-09-25T18:30:52Z  
dc.journal.volume
57  
dc.journal.number
3  
dc.journal.pagination
616-621  
dc.journal.pais
Estados Unidos  
dc.journal.ciudad
Nueva York  
dc.description.fil
Fil: Sonnaillon, Maximiliano Osvaldo. Comision Nacional de Energia Atomica. Fundación Jose A. Balseiro; Argentina  
dc.description.fil
Fil: Urteaga, Raul. Comisión Nacional de Energía Atómica. Gerencia del Área de Energía Nuclear. Instituto Balseiro; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: Bonetto, Fabian Jose. Comisión Nacional de Energía Atómica. Gerencia del Área de Energía Nuclear. Instituto Balseiro; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.journal.title
Ieee Transactions On Instrumentation And Measurement  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1109/TIM.2007.911584  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://ieeexplore.ieee.org/document/4410452/  

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