Artículo
High-frequency Digital Lock-in Amplifier Using Random Sampling
Fecha de publicación:
12/2008
Editorial:
Institute of Electrical and Electronics Engineers
Revista:
Ieee Transactions On Instrumentation And Measurement
ISSN:
0018-9456
Idioma:
Inglés
Tipo de recurso:
Artículo publicado
Clasificación temática:
Resumen
A high-frequency digital lock-in amplifier (LIA) that uses a random-sampling scheme is proposed and tested experimentally in this paper. By using this sampling strategy, it is possible to process, without aliasing effects, periodic signals of frequencies that are several times higher than the Nyquist frequency. Analytical and numerical analyses that show the advantages and limitations of the proposed scheme are presented. A high-frequency digital LIA implementation is also described. The prototype maximum sampling frequency is 150 kHz, and its maximum signal frequency without aliasing is 2.5 MHz, limited only by the random-sampling period quantization. Experimental results that validate the proposal are presented.
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Articulos(CCT - PATAGONIA NORTE)
Articulos de CTRO.CIENTIFICO TECNOL.CONICET - PATAGONIA NORTE
Articulos de CTRO.CIENTIFICO TECNOL.CONICET - PATAGONIA NORTE
Articulos(INTEC)
Articulos de INST.DE DES.TECNOL.PARA LA IND.QUIMICA (I)
Articulos de INST.DE DES.TECNOL.PARA LA IND.QUIMICA (I)
Citación
Sonnaillon, Maximiliano Osvaldo; Urteaga, Raul; Bonetto, Fabian Jose; High-frequency Digital Lock-in Amplifier Using Random Sampling; Institute of Electrical and Electronics Engineers; Ieee Transactions On Instrumentation And Measurement; 57; 3; 12-2008; 616-621
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