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dc.contributor.author
Ferreyra, Romualdo Alejandro
dc.contributor.author
Li, Bingjun
dc.contributor.author
Wang, Sizhen
dc.contributor.author
Han, Jung
dc.date.available
2024-02-28T13:49:21Z
dc.date.issued
2023-05
dc.identifier.citation
Ferreyra, Romualdo Alejandro; Li, Bingjun; Wang, Sizhen; Han, Jung; Selective area doping of GaN towards high-power applications; IOP Publishing; Journal of Physics D: Applied Physics; 56; 37; 5-2023; 1-16
dc.identifier.issn
0022-3727
dc.identifier.uri
http://hdl.handle.net/11336/228801
dc.description.abstract
Selective area doping in GaN, especially p-type, is a critical and inevitable building block for the realization of advanced device structures for high-power applications, including, but not limited to, current-aperture vertical electron transistors, junction termination extensions, junction barrier Schottky diodes, junction field-effect transistors (JFETs), vertical-channel JFETs, U-shaped metal-oxide-semiconductor field-effect transistors (U-MOSFETs), and Fin MOSFETs. This paper reviews and summarizes some of the recent advances in the fields of selective area etching and regrowth, ion implantation, and polarity-dependent doping that may lead to the practical realization of GaN-based power devices.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
IOP Publishing
dc.rights
info:eu-repo/semantics/restrictedAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
GAN
dc.subject
LATERAL REGROWTH
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P-N JUNCTION
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POWER DEVICES
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SELECTIVE AREA DOPING
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SELECTIVE AREA ETCHING
dc.subject.classification
Recubrimientos y Películas
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Ingeniería de los Materiales
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INGENIERÍAS Y TECNOLOGÍAS
dc.title
Selective area doping of GaN towards high-power applications
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2024-02-28T10:24:02Z
dc.journal.volume
56
dc.journal.number
37
dc.journal.pagination
1-16
dc.journal.pais
Reino Unido
dc.journal.ciudad
Londres
dc.description.fil
Fil: Ferreyra, Romualdo Alejandro. Consejo Nacional de Investigaciones Cientificas y Tecnicas. Instituto de Ciencias Fisicas. - Universidad Nacional de San Martin. Instituto de Ciencias Fisicas.; Argentina
dc.description.fil
Fil: Li, Bingjun. University of Yale; Estados Unidos
dc.description.fil
Fil: Wang, Sizhen. University of Yale; Estados Unidos
dc.description.fil
Fil: Han, Jung. University of Yale; Estados Unidos
dc.journal.title
Journal of Physics D: Applied Physics
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://iopscience.iop.org/article/10.1088/1361-6463/acd19d
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1088/1361-6463/acd19d
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