Artículo
Interleaved Readout of Charge-Coupled Devices (CCDs) for Correlated Noise Reduction
Fernández Moroni, Guillermo
; Chierchie, Fernando
; Stefanazzi, Leandro
; Paolini, Eduardo Emilio; Sofo Haro, Miguel Francisco
; Cancelo, Gustavo; Tiffenberg, Javier Sebastian
; Estrada, Juan
Fecha de publicación:
03/2020
Editorial:
Institute of Electrical and Electronics Engineers
Revista:
Ieee Transactions on Instrumentation and Measurement
ISSN:
0018-9456
Idioma:
Inglés
Tipo de recurso:
Artículo publicado
Clasificación temática:
Resumen
This article proposes a new technique to reduce the readout noise in charge-coupled devices (CCDs). The objective is to minimize the common noise between the channels. This noise is either induced by the readout electronics or by the environment, and it could be present in small (single CCD and a few channels) or large systems (dozens of CCDs and hundreds of channels). By interleaving the video signals, we show that it is possible to reduce the readout noise by around 50% without sacrificing output channels at the expense of a moderate increase of the readout time, which is less compared with other techniques. Up until now, similar approaches have used half of the output stages only for noise measurement doubling the total readout time of the sensor. Simulations and experimental results are presented to validate the proposed approach. Moreover, the technique is measured using a Skipper CCD, and its operation is validated together with the ability of the Skipper sensor for nondestructively reading, several times, the same pixel charge. With the combination of both techniques, we achieve deep subelectron readout noise levels (0.1 e-).
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Articulos de INST.DE INVEST.EN ING.ELECTRICA "A.DESAGES"
Articulos de INST.DE INVEST.EN ING.ELECTRICA "A.DESAGES"
Citación
Fernández Moroni, Guillermo; Chierchie, Fernando; Stefanazzi, Leandro; Paolini, Eduardo Emilio; Sofo Haro, Miguel Francisco; et al.; Interleaved Readout of Charge-Coupled Devices (CCDs) for Correlated Noise Reduction; Institute of Electrical and Electronics Engineers; Ieee Transactions on Instrumentation and Measurement; 69; 10; 3-2020; 7580-7587
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