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dc.contributor.author
Libertino, Sebania
dc.contributor.author
Corso, Domenico
dc.contributor.author
Lisiansky, Michael
dc.contributor.author
Roizin, Yakov
dc.contributor.author
Palumbo, Félix Roberto Mario
dc.contributor.author
Principato, Fabio
dc.contributor.author
Pace, Calogero
dc.contributor.author
Finocchiaro, Paolo
dc.contributor.author
Lombardo, Salvatore
dc.date.available
2023-06-02T14:03:16Z
dc.date.issued
2012-12
dc.identifier.citation
Libertino, Sebania; Corso, Domenico; Lisiansky, Michael; Roizin, Yakov; Palumbo, Félix Roberto Mario; et al.; Ionizing radiation effects on non volatile read only memory cells; Institute of Electrical and Electronics Engineers; Ieee Transactions on Nuclear Science; 59; 6; 12-2012; 3016-3020
dc.identifier.issn
0018-9499
dc.identifier.uri
http://hdl.handle.net/11336/199367
dc.description.abstract
Threshold voltage and drain-source current behaviour of nitride read only memories (NROM) were studied both in situ during irradiation or after irradiation with photons and ions. loss fluctuations are well explained by the same Weibull statistics regardless of the irradiation species and total dose. Results of drain current measurements in-situ during irradiation with photons and ions reveal a step-like increase of with the total irradiation dose. A brief physical explanation is also provided.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
Institute of Electrical and Electronics Engineers
dc.rights
info:eu-repo/semantics/openAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
FLASH MEMORIES
dc.subject
NITRIDE READ-ONLY MEMORIES (NROM)
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OXIDE/NITRIDE/OXIDE (ONO)
dc.subject
RADIATION HARDNESS
dc.subject.classification
Ingeniería Eléctrica y Electrónica
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Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información
dc.subject.classification
INGENIERÍAS Y TECNOLOGÍAS
dc.title
Ionizing radiation effects on non volatile read only memory cells
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2023-05-30T12:34:38Z
dc.journal.volume
59
dc.journal.number
6
dc.journal.pagination
3016-3020
dc.journal.pais
Estados Unidos
dc.journal.ciudad
New York
dc.description.fil
Fil: Libertino, Sebania. Consiglio Nazionale delle Ricerche; Italia
dc.description.fil
Fil: Corso, Domenico. Consiglio Nazionale delle Ricerche; Italia
dc.description.fil
Fil: Lisiansky, Michael. No especifíca;
dc.description.fil
Fil: Roizin, Yakov. No especifíca;
dc.description.fil
Fil: Palumbo, Félix Roberto Mario. Comisión Nacional de Energía Atómica; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
dc.description.fil
Fil: Principato, Fabio. Università degli Studi di Palermo; Italia
dc.description.fil
Fil: Pace, Calogero. Università della Calabria; Italia
dc.description.fil
Fil: Finocchiaro, Paolo. No especifíca;
dc.description.fil
Fil: Lombardo, Salvatore. Consiglio Nazionale delle Ricerche; Italia
dc.journal.title
Ieee Transactions on Nuclear Science
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://ieeexplore.ieee.org/document/6340370
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1109/TNS.2012.2219071
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