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dc.contributor.author
Benfica, Juliano  
dc.contributor.author
Poehls, Leticia M. Bolzani  
dc.contributor.author
Vargas, Fabian  
dc.contributor.author
Lipovetzky, José  
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Lutenberg, Ariel  
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García, Sebastián E.  
dc.contributor.author
Gatti, Edmundo  
dc.contributor.author
Hernandez, Fernando  
dc.date.available
2023-05-10T17:33:35Z  
dc.date.issued
2012-08  
dc.identifier.citation
Benfica, Juliano; Poehls, Leticia M. Bolzani; Vargas, Fabian; Lipovetzky, José; Lutenberg, Ariel; et al.; Evaluating the Effects of Combined Total Ionizing Dose Radiation and Electromagnetic Interference; Institute of Electrical and Electronics Engineers; Ieee Transactions on Nuclear Science; 59; 4 PART 1; 8-2012; 1015-1019  
dc.identifier.issn
0018-9499  
dc.identifier.uri
http://hdl.handle.net/11336/197045  
dc.description.abstract
Although measurement methods for Electromagnetic (EM) immunity and Total Ionizing Dose (TID) radiation are highly standardized, no effort has been made to evaluate the behavior of embedded systems under the combined effects. Considering realistic environment conditions only the measurement of these effects can guarantee reliable embedded systems for critical applications. A configurable platform to evaluate the effects of TID radiation and EM Interference (EMI) on embedded systems is presented. Experiments illustrate the consequences regarding delay and fault occurrence probability as well as current consumption and minimum power supply.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
Institute of Electrical and Electronics Engineers  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
ELECTROMAGNETIC IMMUNITY  
dc.subject
EMBEDDED SYSTEMS  
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TOTAL IONIZING DOSE (TID) RADIATION  
dc.subject.classification
Hardware y Arquitectura de Computadoras  
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Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información  
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INGENIERÍAS Y TECNOLOGÍAS  
dc.title
Evaluating the Effects of Combined Total Ionizing Dose Radiation and Electromagnetic Interference  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2023-05-10T10:29:42Z  
dc.journal.volume
59  
dc.journal.number
4 PART 1  
dc.journal.pagination
1015-1019  
dc.journal.pais
Estados Unidos  
dc.journal.ciudad
New York  
dc.description.fil
Fil: Benfica, Juliano. Pontificia Universidade Católica do Rio Grande do Sul; Brasil  
dc.description.fil
Fil: Poehls, Leticia M. Bolzani. Pontificia Universidade Católica do Rio Grande do Sul; Brasil  
dc.description.fil
Fil: Vargas, Fabian. Pontificia Universidade Católica do Rio Grande do Sul; Brasil  
dc.description.fil
Fil: Lipovetzky, José. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad de Buenos Aires; Argentina  
dc.description.fil
Fil: Lutenberg, Ariel. Universidad de Buenos Aires; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: García, Sebastián E.. Universidad de Buenos Aires; Argentina  
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Fil: Gatti, Edmundo. Instituto Nacional de Tecnología Industrial; Argentina  
dc.description.fil
Fil: Hernandez, Fernando. Universidad ORT Uruguay; Uruguay  
dc.journal.title
Ieee Transactions on Nuclear Science  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://ieeexplore.ieee.org/document/6190732  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1109/TNS.2012.2190621  

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