Artículo
Evaluating the Effects of Combined Total Ionizing Dose Radiation and Electromagnetic Interference
Benfica, Juliano; Poehls, Leticia M. Bolzani; Vargas, Fabian; Lipovetzky, José
; Lutenberg, Ariel
; García, Sebastián E.; Gatti, Edmundo; Hernandez, Fernando
Fecha de publicación:
08/2012
Editorial:
Institute of Electrical and Electronics Engineers
Revista:
Ieee Transactions on Nuclear Science
ISSN:
0018-9499
Idioma:
Inglés
Tipo de recurso:
Artículo publicado
Clasificación temática:
Resumen
Although measurement methods for Electromagnetic (EM) immunity and Total Ionizing Dose (TID) radiation are highly standardized, no effort has been made to evaluate the behavior of embedded systems under the combined effects. Considering realistic environment conditions only the measurement of these effects can guarantee reliable embedded systems for critical applications. A configurable platform to evaluate the effects of TID radiation and EM Interference (EMI) on embedded systems is presented. Experiments illustrate the consequences regarding delay and fault occurrence probability as well as current consumption and minimum power supply.
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Articulos(SEDE CENTRAL)
Articulos de SEDE CENTRAL
Articulos de SEDE CENTRAL
Citación
Benfica, Juliano; Poehls, Leticia M. Bolzani; Vargas, Fabian; Lipovetzky, José; Lutenberg, Ariel; et al.; Evaluating the Effects of Combined Total Ionizing Dose Radiation and Electromagnetic Interference; Institute of Electrical and Electronics Engineers; Ieee Transactions on Nuclear Science; 59; 4 PART 1; 8-2012; 1015-1019
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