Mostrar el registro sencillo del ítem

dc.contributor.author
Hegel, C.  
dc.contributor.author
Jones, Carlos Alberto  
dc.contributor.author
Cabrera, Fernanda Anabel  
dc.contributor.author
Yañez, Maria Julia  
dc.contributor.author
Bucala, Veronica  
dc.date.available
2017-03-06T17:43:26Z  
dc.date.issued
2014-03  
dc.identifier.citation
Hegel, C.; Jones, Carlos Alberto; Cabrera, Fernanda Anabel; Yañez, Maria Julia; Bucala, Veronica; Particle size characterization: comparison of laser difraction (LD) and scanning electron microscopy (SEM); Comité Interamericano de Sociedades de Microscopía Electrónica; Acta Microscopica; 23; 1; 3-2014; 11-17  
dc.identifier.issn
0798-4545  
dc.identifier.uri
http://hdl.handle.net/11336/13554  
dc.description.abstract
Two of the most significant properties of particles are size and shape; they often have direct influence on the materials behavior. Since the particulate systems are constituted by 3D particles of different size, the characterization of this property has to be given by a particle size distribution (PSD) . Among the most popular techniques for PSDs measurement, the image analysis (IA) presents some disadvantages: sampling errors, the analysis of only hundred or a few thousand particles to represent the whole population, the use a 2-D projected image of a 3-D particle and long analysis times. In contrast, the laser diffraction technique allows fast particulate systems characterization, processes a high number of particles per assay and provides highly reproducible results. However, LD provides no details about the particle morphology. Both techniques can be considered complementary, however several data interpretation problems appear whe n the results are compared. To do so, it is necessary to understand the meaning of the size descriptors given by each technique and under which conditions the comparison of results from different size analyzers can be done. In this sense, this work explores first the number of particles required to obtain reproducible PSDs by SEM. Then, it presents a comprehensive characterization of PVC particles by assessing a set of size and shape descriptors. The PSDs obtained by IA-SEM and LD were mathematically transformed to be compared. Finally, IA-SEM data was used to evaluate the convenience of using more than one size descriptor to represent the particles volume.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
Comité Interamericano de Sociedades de Microscopía Electrónica  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
Laser Diffraction Analyser  
dc.subject
Sem  
dc.subject
Particle Characterization  
dc.subject
Size Descriptors  
dc.subject.classification
Ingeniería Química  
dc.subject.classification
Ingeniería Química  
dc.subject.classification
INGENIERÍAS Y TECNOLOGÍAS  
dc.title
Particle size characterization: comparison of laser difraction (LD) and scanning electron microscopy (SEM)  
dc.title
Caracterización de tamaños de partícula: comparación entre difracción laser (ld) y microscopía electrónica de barrido (sem)  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2017-03-03T19:00:58Z  
dc.journal.volume
23  
dc.journal.number
1  
dc.journal.pagination
11-17  
dc.journal.pais
Venezuela  
dc.journal.ciudad
Caracas  
dc.description.fil
Fil: Hegel, C.. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Bahía Blanca. Planta Piloto de Ingeniería Química (i); Argentina  
dc.description.fil
Fil: Jones, Carlos Alberto. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Bahia Blanca; Argentina  
dc.description.fil
Fil: Cabrera, Fernanda Anabel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Bahía Blanca. Planta Piloto de Ingeniería Química (i); Argentina  
dc.description.fil
Fil: Yañez, Maria Julia. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Bahia Blanca; Argentina  
dc.description.fil
Fil: Bucala, Veronica. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Bahía Blanca. Planta Piloto de Ingeniería Química (i); Argentina  
dc.journal.title
Acta Microscopica  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://www.actamicroscopica.org/index.php/revista/anteriores