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dc.contributor.author
Hegel, C.
dc.contributor.author
Jones, Carlos Alberto
dc.contributor.author
Cabrera, Fernanda Anabel
dc.contributor.author
Yañez, Maria Julia
dc.contributor.author
Bucala, Veronica
dc.date.available
2017-03-06T17:43:26Z
dc.date.issued
2014-03
dc.identifier.citation
Hegel, C.; Jones, Carlos Alberto; Cabrera, Fernanda Anabel; Yañez, Maria Julia; Bucala, Veronica; Particle size characterization: comparison of laser difraction (LD) and scanning electron microscopy (SEM); Comité Interamericano de Sociedades de Microscopía Electrónica; Acta Microscopica; 23; 1; 3-2014; 11-17
dc.identifier.issn
0798-4545
dc.identifier.uri
http://hdl.handle.net/11336/13554
dc.description.abstract
Two of the most significant properties of particles are size and shape; they often have direct influence on the materials behavior. Since the particulate systems are constituted by 3D particles of different size, the characterization of this property has to be given by a particle size distribution (PSD) . Among the most popular techniques for PSDs measurement, the image analysis (IA) presents some disadvantages: sampling errors, the analysis of only hundred or a few thousand particles to represent the whole population, the use a 2-D projected image of a 3-D particle and long analysis times. In contrast, the laser diffraction technique allows fast particulate systems characterization, processes a high number of particles per assay and provides highly reproducible results. However, LD provides no details about the particle morphology. Both techniques can be considered complementary, however several data interpretation problems appear whe n the results are compared. To do so, it is necessary to understand the meaning of the size descriptors given by each technique and under which conditions the comparison of results from different size analyzers can be done. In this sense, this work explores first the number of particles required to obtain reproducible PSDs by SEM. Then, it presents a comprehensive characterization of PVC particles by assessing a set of size and shape descriptors. The PSDs obtained by IA-SEM and LD were mathematically transformed to be compared. Finally, IA-SEM data was used to evaluate the convenience of using more than one size descriptor to represent the particles volume.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
Comité Interamericano de Sociedades de Microscopía Electrónica
dc.rights
info:eu-repo/semantics/openAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
Laser Diffraction Analyser
dc.subject
Sem
dc.subject
Particle Characterization
dc.subject
Size Descriptors
dc.subject.classification
Ingeniería Química
dc.subject.classification
Ingeniería Química
dc.subject.classification
INGENIERÍAS Y TECNOLOGÍAS
dc.title
Particle size characterization: comparison of laser difraction (LD) and scanning electron microscopy (SEM)
dc.title
Caracterización de tamaños de partícula: comparación entre difracción laser (ld) y microscopía electrónica de barrido (sem)
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2017-03-03T19:00:58Z
dc.journal.volume
23
dc.journal.number
1
dc.journal.pagination
11-17
dc.journal.pais
Venezuela
dc.journal.ciudad
Caracas
dc.description.fil
Fil: Hegel, C.. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Bahía Blanca. Planta Piloto de Ingeniería Química (i); Argentina
dc.description.fil
Fil: Jones, Carlos Alberto. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Bahia Blanca; Argentina
dc.description.fil
Fil: Cabrera, Fernanda Anabel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Bahía Blanca. Planta Piloto de Ingeniería Química (i); Argentina
dc.description.fil
Fil: Yañez, Maria Julia. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Bahia Blanca; Argentina
dc.description.fil
Fil: Bucala, Veronica. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Bahía Blanca. Planta Piloto de Ingeniería Química (i); Argentina
dc.journal.title
Acta Microscopica
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://www.actamicroscopica.org/index.php/revista/anteriores
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