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Artículo

Particle size characterization: comparison of laser difraction (LD) and scanning electron microscopy (SEM)

Título: Caracterización de tamaños de partícula: comparación entre difracción laser (ld) y microscopía electrónica de barrido (sem)
Hegel, C.; Jones, Carlos AlbertoIcon ; Cabrera, Fernanda AnabelIcon ; Yañez, Maria JuliaIcon ; Bucala, VeronicaIcon
Fecha de publicación: 03/2014
Editorial: Comité Interamericano de Sociedades de Microscopía Electrónica
Revista: Acta Microscopica
ISSN: 0798-4545
Idioma: Inglés
Tipo de recurso: Artículo publicado
Clasificación temática:
Ingeniería Química

Resumen

Two of the most significant properties of particles are size and shape; they often have direct influence on the materials behavior. Since the particulate systems are constituted by 3D particles of different size, the characterization of this property has to be given by a particle size distribution (PSD) . Among the most popular techniques for PSDs measurement, the image analysis (IA) presents some disadvantages: sampling errors, the analysis of only hundred or a few thousand particles to represent the whole population, the use a 2-D projected image of a 3-D particle and long analysis times. In contrast, the laser diffraction technique allows fast particulate systems characterization, processes a high number of particles per assay and provides highly reproducible results. However, LD provides no details about the particle morphology. Both techniques can be considered complementary, however several data interpretation problems appear whe n the results are compared. To do so, it is necessary to understand the meaning of the size descriptors given by each technique and under which conditions the comparison of results from different size analyzers can be done. In this sense, this work explores first the number of particles required to obtain reproducible PSDs by SEM. Then, it presents a comprehensive characterization of PVC particles by assessing a set of size and shape descriptors. The PSDs obtained by IA-SEM and LD were mathematically transformed to be compared. Finally, IA-SEM data was used to evaluate the convenience of using more than one size descriptor to represent the particles volume.
Palabras clave: Laser Diffraction Analyser , Sem , Particle Characterization , Size Descriptors
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info:eu-repo/semantics/openAccess Excepto donde se diga explícitamente, este item se publica bajo la siguiente descripción: Creative Commons Attribution-NonCommercial-ShareAlike 2.5 Unported (CC BY-NC-SA 2.5)
Identificadores
URI: http://hdl.handle.net/11336/13554
URL: http://www.actamicroscopica.org/index.php/revista/anteriores
Colecciones
Articulos(PLAPIQUI)
Articulos de PLANTA PILOTO DE INGENIERIA QUIMICA (I)
Citación
Hegel, C.; Jones, Carlos Alberto; Cabrera, Fernanda Anabel; Yañez, Maria Julia; Bucala, Veronica; Particle size characterization: comparison of laser difraction (LD) and scanning electron microscopy (SEM); Comité Interamericano de Sociedades de Microscopía Electrónica; Acta Microscopica; 23; 1; 3-2014; 11-17
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