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dc.contributor.author
Etchepareborda, Pablo Gonzalo
dc.contributor.author
Bianchetti, Arturo Abel
dc.contributor.author
Vadnjal, Ana Laura
dc.contributor.author
Federico, Roque Alejandro
dc.date.available
2021-04-06T19:26:07Z
dc.date.issued
2019-05
dc.identifier.citation
Etchepareborda, Pablo Gonzalo; Bianchetti, Arturo Abel; Vadnjal, Ana Laura; Federico, Roque Alejandro; Evaluation of structural similarity quality measures for wrapped recovered phase maps in optical metrology; Elsevier; Optics And Lasers In Engineering; 116; 5-2019; 103-110
dc.identifier.issn
0143-8166
dc.identifier.uri
http://hdl.handle.net/11336/129468
dc.description.abstract
We propose and evaluate structural similarity quality measures for wrapped recovered phase maps in the range of [0, 2π). The proposed measures adapt the mathematical description of a structural similarity index employed in intensity images by using circular statistics, which are suitable for analyzing the wrapped phase images obtained in the application of optical metrology techniques. The developed framework avoids 2D unwrapping pre-processing techniques and obtains a quality measure that properly evaluates visual distortions that occur in the proximities of phase discontinuities that do not correspond to significant phase errors. Numerical experiments based on the assessment of simulated wrapped images indicate the suitability of the proposed quality measure when a reference phase map is introduced.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
Elsevier
dc.rights
info:eu-repo/semantics/restrictedAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
CIRCULAR STATISTICS
dc.subject
INTERFEROMETRY
dc.subject
PHASE MAP QUALITY
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SPECKLE METROLOGY
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STRUCTURAL SIMILARITY
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WRAPPED PHASE
dc.subject.classification
Ingeniería Eléctrica y Electrónica
dc.subject.classification
Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información
dc.subject.classification
INGENIERÍAS Y TECNOLOGÍAS
dc.title
Evaluation of structural similarity quality measures for wrapped recovered phase maps in optical metrology
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2021-03-25T13:42:39Z
dc.journal.volume
116
dc.journal.pagination
103-110
dc.journal.pais
Países Bajos
dc.journal.ciudad
Amsterdam
dc.description.fil
Fil: Etchepareborda, Pablo Gonzalo. Instituto Nacional de Tecnología Industrial. Centro de Electrónica e Informática; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
dc.description.fil
Fil: Bianchetti, Arturo Abel. Instituto Nacional de Tecnología Industrial. Centro de Electrónica e Informática; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
dc.description.fil
Fil: Vadnjal, Ana Laura. Instituto Nacional de Tecnología Industrial. Centro de Electrónica e Informática; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
dc.description.fil
Fil: Federico, Roque Alejandro. Instituto Nacional de Tecnología Industrial. Centro de Electrónica e Informática; Argentina
dc.journal.title
Optics And Lasers In Engineering
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://www.sciencedirect.com/science/article/abs/pii/S0143816618313988
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/https://doi.org/10.1016/j.optlaseng.2019.01.004
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