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dc.contributor.author
Etchepareborda, Pablo Gonzalo  
dc.contributor.author
Bianchetti, Arturo Abel  
dc.contributor.author
Vadnjal, Ana Laura  
dc.contributor.author
Federico, Roque Alejandro  
dc.date.available
2021-04-06T19:26:07Z  
dc.date.issued
2019-05  
dc.identifier.citation
Etchepareborda, Pablo Gonzalo; Bianchetti, Arturo Abel; Vadnjal, Ana Laura; Federico, Roque Alejandro; Evaluation of structural similarity quality measures for wrapped recovered phase maps in optical metrology; Elsevier; Optics And Lasers In Engineering; 116; 5-2019; 103-110  
dc.identifier.issn
0143-8166  
dc.identifier.uri
http://hdl.handle.net/11336/129468  
dc.description.abstract
We propose and evaluate structural similarity quality measures for wrapped recovered phase maps in the range of [0, 2π). The proposed measures adapt the mathematical description of a structural similarity index employed in intensity images by using circular statistics, which are suitable for analyzing the wrapped phase images obtained in the application of optical metrology techniques. The developed framework avoids 2D unwrapping pre-processing techniques and obtains a quality measure that properly evaluates visual distortions that occur in the proximities of phase discontinuities that do not correspond to significant phase errors. Numerical experiments based on the assessment of simulated wrapped images indicate the suitability of the proposed quality measure when a reference phase map is introduced.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
Elsevier  
dc.rights
info:eu-repo/semantics/restrictedAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
CIRCULAR STATISTICS  
dc.subject
INTERFEROMETRY  
dc.subject
PHASE MAP QUALITY  
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SPECKLE METROLOGY  
dc.subject
STRUCTURAL SIMILARITY  
dc.subject
WRAPPED PHASE  
dc.subject.classification
Ingeniería Eléctrica y Electrónica  
dc.subject.classification
Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información  
dc.subject.classification
INGENIERÍAS Y TECNOLOGÍAS  
dc.title
Evaluation of structural similarity quality measures for wrapped recovered phase maps in optical metrology  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2021-03-25T13:42:39Z  
dc.journal.volume
116  
dc.journal.pagination
103-110  
dc.journal.pais
Países Bajos  
dc.journal.ciudad
Amsterdam  
dc.description.fil
Fil: Etchepareborda, Pablo Gonzalo. Instituto Nacional de Tecnología Industrial. Centro de Electrónica e Informática; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: Bianchetti, Arturo Abel. Instituto Nacional de Tecnología Industrial. Centro de Electrónica e Informática; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: Vadnjal, Ana Laura. Instituto Nacional de Tecnología Industrial. Centro de Electrónica e Informática; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: Federico, Roque Alejandro. Instituto Nacional de Tecnología Industrial. Centro de Electrónica e Informática; Argentina  
dc.journal.title
Optics And Lasers In Engineering  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://www.sciencedirect.com/science/article/abs/pii/S0143816618313988  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/https://doi.org/10.1016/j.optlaseng.2019.01.004