Artículo
PolishEM: Image enhancement in FIB-SEM
Fernandez, Jose Jesus; Torres Molina, Teobaldo Enrique
; Martin Solana, Eva; Goya, Gerardo Fabian; Fernandez Fernandez, Maria Rosario
Fecha de publicación:
03/2020
Editorial:
Oxford University Press
Revista:
Bioinformatics (Oxford, England)
ISSN:
1367-4803
Idioma:
Inglés
Tipo de recurso:
Artículo publicado
Clasificación temática:
Resumen
We have developed a software tool to improve the image quality in focused ion beam-scanning electron microscopy (FIB-SEM) stacks: PolishEM. Based on a Gaussian blur model, it automatically estimates and compensates for the blur affecting each individual image. It also includes correction for artifacts commonly arising in FIB-SEM (e.g. curtaining). PolishEM has been optimized for an efficient processing of huge FIB-SEM stacks on standard computers.
Palabras clave:
FIB-SEM
,
IMAGE ENHANCEMENT
,
CELLS
,
ELECTRON MICROSCOPY
Archivos asociados
Licencia
Identificadores
Colecciones
Articulos(CCT - PATAGONIA NORTE)
Articulos de CTRO.CIENTIFICO TECNOL.CONICET - PATAGONIA NORTE
Articulos de CTRO.CIENTIFICO TECNOL.CONICET - PATAGONIA NORTE
Citación
Fernandez, Jose Jesus; Torres Molina, Teobaldo Enrique; Martin Solana, Eva; Goya, Gerardo Fabian; Fernandez Fernandez, Maria Rosario; PolishEM: Image enhancement in FIB-SEM; Oxford University Press; Bioinformatics (Oxford, England); 36; 12; 3-2020; 3947-3948
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