Bezerra Cabral, Antonio Eduardo

PRODUCCION CIENTÍFICO TECNOLÓGICA

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Artículo Analysis of SRAM-Based FPGA SEU Sensitivity to Combined EMI and TID-Imprinted Effects

Benfica, Juliano; Green, Bruno; Porcher, Bruno C.; Bolzani Poehls, Letícia; Vargas, Fabian; Medina, Nilberto H.; Added, Nemitala; P. de Aguiar, Vitor A.; Macchione, Eduardo L. A.; Aguirre, Fernando; Silveira. Marcilei A.G.; Pérez, Martín ; Sofo Haro, Miguel Francisco ; Sidelnik, Iván Pedro ; Blostein, Juan Jeronimo ; Lipovetzky, José ; Bezerra Cabral, Antonio Eduardo (Institute of Electrical and Electronics Engineers, 2016-04-20)

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