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dc.contributor.author
Moya Riffo, Alvaro Esteban  
dc.contributor.author
Bennun, L.  
dc.contributor.author
Sanhueza, V.  
dc.contributor.author
Santibañez, M.  
dc.date.available
2016-12-20T21:21:56Z  
dc.date.issued
2013-01  
dc.identifier.citation
Moya Riffo, Alvaro Esteban; Bennun, L. ; Sanhueza, V. ; Santibañez, M.; A procedure for overlapping deconvolution and the determination of its confidence interval for arsenic and lead signals in TXRF spectral analysis; Wiley; X-ray Spectrometry; 42; 2; 1-2013; 93-99  
dc.identifier.issn
0049-8246  
dc.identifier.uri
http://hdl.handle.net/11336/9876  
dc.description.abstract
We studied the applicability and validity range of a mathematical procedure on the basis of the principia of maximum likelihood for the identification and quantification of arsenic and lead. This procedure has showed to be appropriate for analyzing two or more signals that interfere with each other or for the quantification of a small signal in a very noisy environment, but a complete study of determination of its confidence interval in samples in which one element in the overlap is present in a concentration lower than the other elements was not studied previously. The identification implemented provides very exact values of relative concentrations for cases that are difficult to process using other adjustment methods. The proposed procedure is applied to experimental cases, analyzing liquid solutions through total reflection X-ray fluorescence to determine a range of concentrations for the detection of traces of arsenic signals in the presence of large lead interfering signals and vice versa.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
Wiley  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
Txrf Spectral Analysis  
dc.subject
Arsenic  
dc.subject.classification
Física Atómica, Molecular y Química  
dc.subject.classification
Ciencias Físicas  
dc.subject.classification
CIENCIAS NATURALES Y EXACTAS  
dc.title
A procedure for overlapping deconvolution and the determination of its confidence interval for arsenic and lead signals in TXRF spectral analysis  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2016-12-19T18:20:22Z  
dc.journal.volume
42  
dc.journal.number
2  
dc.journal.pagination
93-99  
dc.journal.pais
Reino Unido  
dc.journal.ciudad
Londres  
dc.description.fil
Fil: Moya Riffo, Alvaro Esteban. Universidad de Concepción; Chile. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina  
dc.description.fil
Fil: Bennun, L. . Universidad de Concepción; Chile  
dc.description.fil
Fil: Sanhueza, V. . Universidad de Concepción; Chile  
dc.description.fil
Fil: Santibañez, M.. Universidad de Concepción; Chile  
dc.journal.title
X-ray Spectrometry  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://onlinelibrary.wiley.com/doi/10.1002/xrs.2439/full  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1002/xrs.2439