Mostrar el registro sencillo del ítem
dc.contributor.author
Haberman, Marcelo Alejandro
dc.contributor.author
Spinelli, Enrique Mario
dc.date.available
2020-01-06T20:53:29Z
dc.date.issued
2018-08
dc.identifier.citation
Haberman, Marcelo Alejandro; Spinelli, Enrique Mario; Noncontact AC Voltage Measurements: Error and Noise Analysis; Institute of Electrical and Electronics Engineers; Ieee Transactions on Instrumentation and Measurement; 67; 8; 8-2018; 1946-1953
dc.identifier.issn
0018-9456
dc.identifier.uri
http://hdl.handle.net/11336/93729
dc.description.abstract
A capacitive noncontact ac voltage measurement technique and its feasibility to measure arbitrary waveform signals are analyzed. The method provides self-calibration of the scale factor, an important feature considering the high variability that coupling capacitances present. The analysis of several errors related to the technique is performed, showing the impact of different design parameters on the final accuracy. Scaling errors due to the electronic circuit can be constrained to less than 0.5%, and can be disaffected, whereas those due to the frequency dependence of cable sheath permittivity can be up to 3% for polyvinyl chloride sheathed cables. This error is not controllable by electronic design but requires working on electrode probe. A noise model is also proposed and experimentally validated, showing that signal-to-noise ratios of up to 100 dB are achievable with common components. A functional prototype was built and tested by acquiring power-line voltage and other arbitrary signals without contact. Instantaneous voltage signals were acquired by the proposed technique and contrasted with those acquired directly. For the measurement of power-line voltage and using the self-calibration feature, the instantaneous error was lower than 7 V (2.2%) for a ±1300 V measurement range at 50 Hz. If manual correction is applied, the error can be reduced to 0.28 V rms (0.12%)
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
Institute of Electrical and Electronics Engineers
dc.rights
info:eu-repo/semantics/openAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
CAPACITIVE SENSOR
dc.subject
NONCONTACT VOLTAGE
dc.subject.classification
Ingeniería Eléctrica y Electrónica
dc.subject.classification
Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información
dc.subject.classification
INGENIERÍAS Y TECNOLOGÍAS
dc.title
Noncontact AC Voltage Measurements: Error and Noise Analysis
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2019-10-08T13:19:17Z
dc.identifier.eissn
1557-9662
dc.journal.volume
67
dc.journal.number
8
dc.journal.pagination
1946-1953
dc.journal.pais
Estados Unidos
dc.description.fil
Fil: Haberman, Marcelo Alejandro. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Instituto de Investigaciones en Electrónica, Control y Procesamiento de Señales. Universidad Nacional de La Plata. Instituto de Investigaciones en Electrónica, Control y Procesamiento de Señales; Argentina
dc.description.fil
Fil: Spinelli, Enrique Mario. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Instituto de Investigaciones en Electrónica, Control y Procesamiento de Señales. Universidad Nacional de La Plata. Instituto de Investigaciones en Electrónica, Control y Procesamiento de Señales; Argentina
dc.journal.title
Ieee Transactions on Instrumentation and Measurement
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://ieeexplore.ieee.org/document/8315496/
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/https://doi.org/10.1109/TIM.2018.2809079
Archivos asociados