Artículo
Analysis of the Effect of Soil Roughness in the Forward-Scattering Interference Pattern Using Second-Order Small Perturbation Method Simulations
Franco, Mariano Andrés
; More, Emanuel; Roitberg, Esteban Gabriel
; Grings, Francisco Matias
; Piegari, Estefanía
; Douna, Vanesa Mariel
; Perna, Pablo Alejandro
Fecha de publicación:
12/2018
Editorial:
Institute of Electrical and Electronics Engineers
Revista:
Ieee Geoscience and Remote Sensing Letters
ISSN:
1545-598X
Idioma:
Inglés
Tipo de recurso:
Artículo publicado
Clasificación temática:
Resumen
Soil moisture (SM) is a key geophysical variable that can be estimated at regional scales using remote sensing techniques, by making use of the known relationship between soil reflectivity and the dielectric constant in the microwave regime. In this context, the exploitation of available illuminators of opportunity that currently emit large amounts of power at microwave frequencies (compared to typical synthetic aperture radar systems) is promising. Some published techniques estimate SM by analyzing the interference pattern (IP) between direct and reflected signal as measured by a single antenna (i.e., IP technique). In this letter, a new approach to simulate the IP is proposed, in which the soil roughness is modeled straightforwardly using the second-order small perturbation model. Results illustrate that the ``notch´´ in the VV-polarization IP (related to the Brewster angle) can only be directly observed for very low values of soil rms roughness (s < 0.5 cm). For typical values of soil roughness (s~ 1.2 cm), the notch disappears and only a minimum in the IP is observed near the Brewster angle.
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Identificadores
Colecciones
Articulos(IAFE)
Articulos de INST.DE ASTRONOMIA Y FISICA DEL ESPACIO(I)
Articulos de INST.DE ASTRONOMIA Y FISICA DEL ESPACIO(I)
Citación
Franco, Mariano Andrés; More, Emanuel; Roitberg, Esteban Gabriel; Grings, Francisco Matias; Piegari, Estefanía; et al.; Analysis of the Effect of Soil Roughness in the Forward-Scattering Interference Pattern Using Second-Order Small Perturbation Method Simulations; Institute of Electrical and Electronics Engineers; Ieee Geoscience and Remote Sensing Letters; 16; 5; 12-2018; 692-696
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