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dc.contributor.author
Bierzychudek, Marcos Eduardo  
dc.contributor.author
Sanchez Peña, Ricardo Salvador  
dc.contributor.author
Tonina, Alejandra  
dc.date.available
2019-10-17T21:39:27Z  
dc.date.issued
2013-06  
dc.identifier.citation
Bierzychudek, Marcos Eduardo; Sanchez Peña, Ricardo Salvador; Tonina, Alejandra; Robust control of a two-terminal cryogenic current comparator; Institute of Electrical and Electronics Engineers; Ieee Transactions on Instrumentation and Measurement; 62; 6; 6-2013; 1736-1742  
dc.identifier.issn
0018-9456  
dc.identifier.uri
http://hdl.handle.net/11336/86256  
dc.description.abstract
A digital H controller for a two-terminal cryogenic current comparator is designed. To this end, a set of mathematical models covering the actual system is proposed. Simulation results compare the open-and closed-loop systems based on the proposed controller and the traditional integral control. According to these results, the new controller can significantly reduce the noise in the superconducting quantum interference device sensor.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
Institute of Electrical and Electronics Engineers  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
CURRENT COMPARATORS  
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CURRENT MEASUREMENT  
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H-INFINITY CONTROL  
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RESISTANCE MEASUREMENTS  
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SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE (SQUID)  
dc.subject.classification
Sistemas de Automatización y Control  
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Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información  
dc.subject.classification
INGENIERÍAS Y TECNOLOGÍAS  
dc.title
Robust control of a two-terminal cryogenic current comparator  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2019-10-17T13:43:20Z  
dc.journal.volume
62  
dc.journal.number
6  
dc.journal.pagination
1736-1742  
dc.journal.pais
Estados Unidos  
dc.journal.ciudad
Albuquerque  
dc.description.fil
Fil: Bierzychudek, Marcos Eduardo. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Instituto Nacional de Tecnología Industrial; Argentina  
dc.description.fil
Fil: Sanchez Peña, Ricardo Salvador. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Instituto Tecnológico de Buenos Aires; Argentina  
dc.description.fil
Fil: Tonina, Alejandra. Instituto Nacional de Tecnología Industrial; Argentina  
dc.journal.title
Ieee Transactions on Instrumentation and Measurement  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1109/TIM.2013.2240954  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://ieeexplore.ieee.org/document/6466382