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dc.contributor.author
Burmeister, F  
dc.contributor.author
Comedi, David Mario  
dc.contributor.author
Chambouleyron, I.  
dc.date.available
2019-10-11T13:42:27Z  
dc.date.issued
2006-12  
dc.identifier.citation
Burmeister, F; Comedi, David Mario; Chambouleyron, I.; Bismuth doping of hydrogenated amorphous germanium thin films; Elsevier Science Sa; Thin Solid Films; 515; 4; 12-2006; 2442-2446  
dc.identifier.issn
0040-6090  
dc.identifier.uri
http://hdl.handle.net/11336/85674  
dc.description.abstract
The optoelectronic properties of Bi-doped hydrogenated amorphous germanium (a-Ge:H), with relative impurity concentrations [Nimp/NGe] ranging between 8 × 10− 6 and 5.5 × 10− 3, are reported. The incorporation of Bi produces small changes in the dark conductivity of a-Ge:H. For a three orders of magnitude change in impurity concentration the room-temperature conductivity changes by just one order of magnitude. Within this doping range no, or small, changes were measured in the values of the pseudo-gap, the Urbach energy, and the hydrogen content. The Fermi level always remains far from the conduction band edge, shifting by only 0.1 eV for the sample with the largest doping concentration. The main conclusion is that Bi is a very inefficient active donor in a-Ge:H. The likely reasons for such behavior are discussed.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
Elsevier Science Sa  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
Doping  
dc.subject
Amorphous germanium  
dc.subject
Bismuth  
dc.subject
Fermi level  
dc.subject.classification
Física de los Materiales Condensados  
dc.subject.classification
Ciencias Físicas  
dc.subject.classification
CIENCIAS NATURALES Y EXACTAS  
dc.title
Bismuth doping of hydrogenated amorphous germanium thin films  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2019-09-30T20:45:28Z  
dc.journal.volume
515  
dc.journal.number
4  
dc.journal.pagination
2442-2446  
dc.journal.pais
Países Bajos  
dc.journal.ciudad
Holanda  
dc.description.fil
Fil: Burmeister, F. Uppsala University; Suecia. Universidade Estadual de Campinas; Brasil  
dc.description.fil
Fil: Comedi, David Mario. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Sólido; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Tucumán; Argentina  
dc.description.fil
Fil: Chambouleyron, I.. Universidade Estadual de Campinas; Brasil  
dc.journal.title
Thin Solid Films  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/https://dx.doi.org/10.1016/j.tsf.2006.06.021  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://www.sciencedirect.com/science/article/pii/S0040609006007772?via%3Dihub