Artículo
Morphology and and thermal stability of AlF3 thin films grown on Cu(100)
Ruano Sandoval, Gonzalo Javier
; Moreno López, Juan Carlos
; Passeggi, Mario Cesar Guillermo
; Vidal, Ricardo Alberto
; Ferron, Julio
; Niño, M.Á.; Miranda, R.; De Miguel, J.J.
Fecha de publicación:
03/2012
Editorial:
Elsevier Science
Revista:
Surface Science
ISSN:
0039-6028
Idioma:
Inglés
Tipo de recurso:
Artículo publicado
Clasificación temática:
Resumen
The growth of ultrathin epitaxial layers of aluminum fluoride on Cu(100) has been studied by a combination of surface science techniques. Deposition at room temperature results in step decoration followed by the formation of dendritic two-dimensional islands that coalesce to form porous films. Ultrathin layers (up to 2 monolayers in thickness) are morphologically unstable upon annealing; de-wetting takes place around 430 K with the formation of three-dimensional islands and leaving a large fraction of the Cu surface uncovered. Films several nanometers thick, on the contrary, are stable up to ca. 730 K where desorption in molecular form sets on. The effect of electron irradiation on the AlF 3 has also been characterized by different spectroscopic techniques; we find that even small quantities of stray electrons from rear electron beam heating can provoke significant decomposition of the aluminum fluoride, resulting in the release of molecular fluorine and the formation of deposits of metallic aluminum. These features make AlF 3 an interesting material for spintronic applications.
Palabras clave:
Aluminum Fluoride
,
Electron Beam Resist
,
Insulators
,
Radiolysis
,
Spintronics
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Articulos(INTEC)
Articulos de INST.DE DES.TECNOL.PARA LA IND.QUIMICA (I)
Articulos de INST.DE DES.TECNOL.PARA LA IND.QUIMICA (I)
Citación
Ruano Sandoval, Gonzalo Javier; Moreno López, Juan Carlos; Passeggi, Mario Cesar Guillermo; Vidal, Ricardo Alberto; Ferron, Julio; et al.; Morphology and and thermal stability of AlF3 thin films grown on Cu(100); Elsevier Science; Surface Science; 606; 5-6; 3-2012; 573-579
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