Artículo
Fullerene-silicon polymerization evidence
Di Liscia, Emiliano Javier; Huck Iriart, Cristián
; Halac, Emilia Beatriz; Reinoso, Maria Elba
; Huck, Hugo Alberto
Fecha de publicación:
12/2017
Editorial:
Open Access Text
Revista:
Interdisciplinary Journal of Chemistry
ISSN:
2398-7537
Idioma:
Inglés
Tipo de recurso:
Artículo publicado
Clasificación temática:
Resumen
We report experimental results for C<sub>60</sub>-Si deposition by simultaneous thermal vaporization of fullerene source and chemical vapor deposition from silane source. The samples were characterized by Scanning Electron Microscopy, Energy-dispersive X-ray spectroscopy, Micro-Raman spectroscopy, Wide-angle X-ray scattering, X-ray photoelectron spectroscopy and its thermal stability was studied, discussed and compared with pure C<sub>60</sub> deposited by the same method. A crystalline material was obtained and results suggest that a polymerization of fullerenes bridged by silicon atoms was achieved.
Palabras clave:
Fullerene
,
Si-C60
,
Raman
,
Waxs
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Licencia
Identificadores
Colecciones
Articulos(SEDE CENTRAL)
Articulos de SEDE CENTRAL
Articulos de SEDE CENTRAL
Citación
Di Liscia, Emiliano Javier; Huck Iriart, Cristián; Halac, Emilia Beatriz; Reinoso, Maria Elba; Huck, Hugo Alberto; Fullerene-silicon polymerization evidence; Open Access Text; Interdisciplinary Journal of Chemistry; 2; 2; 12-2017; 1-4
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