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dc.contributor.author
Simon, Juan Miguel  
dc.contributor.author
Comastri, Silvia Ana Elva  
dc.contributor.author
Echarri, Rodolfo Manuel  
dc.date.available
2019-03-18T20:25:23Z  
dc.date.issued
2001-07  
dc.identifier.citation
Simon, Juan Miguel; Comastri, Silvia Ana Elva; Echarri, Rodolfo Manuel; The Mach-Zehnder interferometer: Examination of a volume by non-classical localization plane shifting; IOP Publishing; Journal of Optics. A, Pure and Applied Optics (print); 3; 4; 7-2001; 242-249  
dc.identifier.issn
1464-4258  
dc.identifier.uri
http://hdl.handle.net/11336/71940  
dc.description.abstract
The Mach-Zehnder interferometer can be used as is customary in optical testing but, to examine different layers of a volume, the procedure of either readjusting the interferometer or displacing the specimen can be avoided, employing an incoherent periodic source. In this case, leaving the specimen in a fixed position and without readjusting the interferometer, the different layers can be analysed, shifting a non-classical localization plane by a change in the source period. In this paper experimental interferograms, obtained by varying this period to map the disturbances present on either one or both faces of a phase object, are shown.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
IOP Publishing  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
Interferometry  
dc.subject
Transparent Media Exploration  
dc.subject.classification
Astronomía  
dc.subject.classification
Ciencias Físicas  
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CIENCIAS NATURALES Y EXACTAS  
dc.title
The Mach-Zehnder interferometer: Examination of a volume by non-classical localization plane shifting  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2019-03-14T14:21:39Z  
dc.journal.volume
3  
dc.journal.number
4  
dc.journal.pagination
242-249  
dc.journal.pais
Reino Unido  
dc.journal.ciudad
Londres  
dc.description.fil
Fil: Simon, Juan Miguel. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Departamento de Física. Laboratorio de Óptica; Argentina  
dc.description.fil
Fil: Comastri, Silvia Ana Elva. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria; Argentina. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Departamento de Física. Laboratorio de Óptica; Argentina  
dc.description.fil
Fil: Echarri, Rodolfo Manuel. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria; Argentina. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Departamento de Física. Laboratorio de Óptica; Argentina  
dc.journal.title
Journal of Optics. A, Pure and Applied Optics (print)  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://iopscience.iop.org/article/10.1088/1464-4258/3/4/303  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/https://doi.org/10.1088/1464-4258/3/4/303