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dc.contributor.author
Petaccia, Mauricio Germán
dc.contributor.author
Castellano, Gustavo Eugenio
dc.date.available
2019-02-19T18:31:54Z
dc.date.issued
2018-05-27
dc.identifier.citation
Petaccia, Mauricio Germán; Castellano, Gustavo Eugenio; Lateral sensitivity in electron probe microanalysis studied by Monte Carlo simulations involving fluorescence enhancements; Wiley Blackwell Publishing, Inc; Journal Of Microscopy-oxford; 270; 2; 27-5-2018; 136-141
dc.identifier.issn
0022-2720
dc.identifier.uri
http://hdl.handle.net/11336/70472
dc.description.abstract
In electron probe microanalysis, secondary fluorescence can occur leading to an increase of the volume analysed, degrading the lateral resolution of this technique. An adequate knowledge of the interaction volumes from where the different signals of interest are detected is determinant to estimate the minimum size of the zone that can be characterized. In this work, the size of the signal source volume is surveyed for a wide set of samples at different beam energies. To this aim, the PENELOPE software package was chosen to run Monte Carlo simulations for several experimental situations in order to produce the various lateral radiation distributions of interest. A comparison between the interaction volumes of the different signals was performed by taking into account the different fluorescence enhancement possibilities. An unexpected behaviour was found in the particular cases of aluminium and alumina, where the secondary photons signal exhibits a decreasing trend up to certain beam energy (∼17 keV); this implies that lower beam energies may degrade the lateral resolution of the technique in these materials.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
Wiley Blackwell Publishing, Inc
dc.rights
info:eu-repo/semantics/restrictedAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
Epma
dc.subject
Fluorescence Enhancement
dc.subject
Monte Carlo Simulation
dc.subject
Spatial Sensitivity
dc.subject.classification
Astronomía
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Ciencias Físicas
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CIENCIAS NATURALES Y EXACTAS
dc.title
Lateral sensitivity in electron probe microanalysis studied by Monte Carlo simulations involving fluorescence enhancements
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2019-02-12T14:31:58Z
dc.journal.volume
270
dc.journal.number
2
dc.journal.pagination
136-141
dc.journal.pais
Reino Unido
dc.journal.ciudad
Londres
dc.description.fil
Fil: Petaccia, Mauricio Germán. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Patagonia Norte; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Física Enrique Gaviola. Universidad Nacional de Córdoba. Instituto de Física Enrique Gaviola; Argentina. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomia y Física. Grupo de Espectroscopia Atomica y Nuclear; Argentina
dc.description.fil
Fil: Castellano, Gustavo Eugenio. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Física Enrique Gaviola. Universidad Nacional de Córdoba. Instituto de Física Enrique Gaviola; Argentina. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomia y Física. Grupo de Espectroscopia Atomica y Nuclear; Argentina
dc.journal.title
Journal Of Microscopy-oxford
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1111/jmi.12666
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://onlinelibrary.wiley.com/doi/pdf/10.1111/jmi.12666
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