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dc.contributor.author
Schulman, Alejandro Raúl  
dc.contributor.author
Acha, Carlos Enrique  
dc.date.available
2015-06-11T16:20:19Z  
dc.date.issued
2013-12  
dc.identifier.citation
Schulman, Alejandro Raúl; Acha, Carlos Enrique; Cyclic electric field stress on bipolar resistive switching devices; American Institute of Physics; Journal of Applied Physics; 114; 24; 12-2013; 243706/5  
dc.identifier.issn
0021-8979  
dc.identifier.uri
http://hdl.handle.net/11336/673  
dc.description.abstract
We have studied the effects of accumulating cyclic electrical pulses of increasing amplitude on the non-volatile resistance state of interfaces made by sputtering a metal (Au, Pt) on top of the surface of a cuprate superconductor YBa2Cu3O7-δ. We have analyzed the influence of the number of applied pulses N on the relative amplitude of the remnant resistance change between the high (RH ) and the low (RL ) state [(α=(RH−RL)/RL] at different temperatures (T). We show that the critical voltage (Vc ) needed to produce a resistive switching (RS, i.e., α>0 ) decreases with increasing N or T. We also find a power law relation between the voltage of the pulses and the number of pulses Nα0 required to produce a RS of α=α0 . This relation remains very similar to the Basquin equation used to describe the stress-fatigue lifetime curves in mechanical tests. This points out to the similarity between the physics of the RS, associated with the diffusion of oxygen vacancies induced by electrical pulses, and the propagation of defects in materials subjected to repeated mechanical stress.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
American Institute of Physics  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
Resistive Switching  
dc.subject
Vacancies  
dc.subject
Electromigration  
dc.subject.classification
Física de los Materiales Condensados  
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Ciencias Físicas  
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CIENCIAS NATURALES Y EXACTAS  
dc.title
Cyclic electric field stress on bipolar resistive switching devices  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2016-03-30 10:35:44.97925-03  
dc.journal.volume
114  
dc.journal.number
24  
dc.journal.pagination
243706/5  
dc.journal.pais
Estados Unidos  
dc.journal.ciudad
New York  
dc.description.fil
Fil: Schulman, Alejandro Raúl. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; Argentina  
dc.description.fil
Fil: Acha, Carlos Enrique. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; Argentina  
dc.journal.title
Journal of Applied Physics  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1063/1.4859475  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://aip.scitation.org/doi/10.1063/1.4859475