Analysis of line profiles from transient plasmas using a pseudo-Fano function

Abstract

A method for the analysis of line profiles based in the pseudo-Fano function was developed, which results of more simple application than the Voigt function usually employed in Spectroscopy to represent the line shapes. A pseudo-Fano function was constructed which describe properly the different effects occurring in plasma sources and subsequently reflected in the measured profiles. The method was successfully evaluated for Co I lines recorded from a LIBS experiment and for a Xe II line from a high-current pinched discharge. In addition, the optically thin lines were retrieved and used for the determination of the gA relative ratios of the Co I lines. Overall, the good general agreement found between the proposed model and the experiments demonstrated its suitability for spectroscopic applications.