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dc.contributor.author
Gallardo, R. A.
dc.contributor.author
Khanal, S.
dc.contributor.author
Vargas, Jose Marcelo
dc.contributor.author
Spinu, L.
dc.contributor.author
Ross, C. A.
dc.contributor.author
Garcia, C.
dc.date.available
2018-11-28T17:43:20Z
dc.date.issued
2017-01-24
dc.identifier.citation
Gallardo, R. A.; Khanal, S.; Vargas, Jose Marcelo; Spinu, L.; Ross, C. A.; et al.; Angular dependent FORC and FMR of exchange-biased NiFe multilayer films; IOP Publishing; Journal of Physics D: Applied Physics; 50; 7; 24-1-2017; 1-10; 075002
dc.identifier.issn
0022-3727
dc.identifier.uri
http://hdl.handle.net/11336/65456
dc.description.abstract
Dynamic ferromagnetic resonance (FMR, X-band 9.8 GHz) and static first-order reversal curve (FORC) techniques are combined to study the intrinsic exchange-bias distribution via measurements of in-plane angular variation in (FeNi/IrMn)n multilayers. The angular dependence of the exchange bias field was qualitatively and quantitatively investigated using both methods, which are sensitive to different couplings between the ferromagnetic layers. We have used the analysis of the angular dependence of first-order reversal curve (AFORC) data, extracted from FORC curves measured from up to in steps. In addition, its counterpart angular dependence of FMR (AFMR) measurements were carried out and correlated with the AFORC results. The AFORC proved to be useful for simultaneously studying the magnetization reversal processes and magnetic interactions between the layers of the (FeNi/IrMn)n. These interactions are related to the structure and interfaces in the (FeNi/IrMn), and the results obtained by AFMR and AFORC are contrasted with a modified theoretical model for domain-wall formation.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
IOP Publishing
dc.rights
info:eu-repo/semantics/openAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
Exchange-Bias
dc.subject
Ferromagnetic Resonance
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First-Order Reversal Curves
dc.subject.classification
Nano-materiales
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Nanotecnología
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INGENIERÍAS Y TECNOLOGÍAS
dc.title
Angular dependent FORC and FMR of exchange-biased NiFe multilayer films
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2018-10-29T15:09:43Z
dc.journal.volume
50
dc.journal.number
7
dc.journal.pagination
1-10; 075002
dc.journal.pais
Reino Unido
dc.journal.ciudad
Londres
dc.description.fil
Fil: Gallardo, R. A.. Universidad Tecnica Federico Santa María; Chile
dc.description.fil
Fil: Khanal, S.. University of New Orleans; Estados Unidos
dc.description.fil
Fil: Vargas, Jose Marcelo. Comisión Nacional de Energía Atómica; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Patagonia Norte; Argentina
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Fil: Spinu, L.. University of New Orleans; Estados Unidos
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Fil: Ross, C. A.. Massachusetts Institute of Technology; Estados Unidos
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Fil: Garcia, C.. Universidad Tecnica Federico Santa María; Chile
dc.journal.title
Journal of Physics D: Applied Physics
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1088/1361-6463/aa5613
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://iopscience.iop.org/article/10.1088/1361-6463/aa5613/meta
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