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dc.contributor.author
Gallardo, R. A.  
dc.contributor.author
Khanal, S.  
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Vargas, Jose Marcelo  
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Spinu, L.  
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Ross, C. A.  
dc.contributor.author
Garcia, C.  
dc.date.available
2018-11-28T17:43:20Z  
dc.date.issued
2017-01-24  
dc.identifier.citation
Gallardo, R. A.; Khanal, S.; Vargas, Jose Marcelo; Spinu, L.; Ross, C. A.; et al.; Angular dependent FORC and FMR of exchange-biased NiFe multilayer films; IOP Publishing; Journal of Physics D: Applied Physics; 50; 7; 24-1-2017; 1-10; 075002  
dc.identifier.issn
0022-3727  
dc.identifier.uri
http://hdl.handle.net/11336/65456  
dc.description.abstract
Dynamic ferromagnetic resonance (FMR, X-band 9.8 GHz) and static first-order reversal curve (FORC) techniques are combined to study the intrinsic exchange-bias distribution via measurements of in-plane angular variation in (FeNi/IrMn)n multilayers. The angular dependence of the exchange bias field was qualitatively and quantitatively investigated using both methods, which are sensitive to different couplings between the ferromagnetic layers. We have used the analysis of the angular dependence of first-order reversal curve (AFORC) data, extracted from FORC curves measured from up to in steps. In addition, its counterpart angular dependence of FMR (AFMR) measurements were carried out and correlated with the AFORC results. The AFORC proved to be useful for simultaneously studying the magnetization reversal processes and magnetic interactions between the layers of the (FeNi/IrMn)n. These interactions are related to the structure and interfaces in the (FeNi/IrMn), and the results obtained by AFMR and AFORC are contrasted with a modified theoretical model for domain-wall formation.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
IOP Publishing  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
Exchange-Bias  
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Ferromagnetic Resonance  
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First-Order Reversal Curves  
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Nano-materiales  
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Nanotecnología  
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INGENIERÍAS Y TECNOLOGÍAS  
dc.title
Angular dependent FORC and FMR of exchange-biased NiFe multilayer films  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2018-10-29T15:09:43Z  
dc.journal.volume
50  
dc.journal.number
7  
dc.journal.pagination
1-10; 075002  
dc.journal.pais
Reino Unido  
dc.journal.ciudad
Londres  
dc.description.fil
Fil: Gallardo, R. A.. Universidad Tecnica Federico Santa María; Chile  
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Fil: Khanal, S.. University of New Orleans; Estados Unidos  
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Fil: Vargas, Jose Marcelo. Comisión Nacional de Energía Atómica; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Patagonia Norte; Argentina  
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Fil: Spinu, L.. University of New Orleans; Estados Unidos  
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Fil: Ross, C. A.. Massachusetts Institute of Technology; Estados Unidos  
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Fil: Garcia, C.. Universidad Tecnica Federico Santa María; Chile  
dc.journal.title
Journal of Physics D: Applied Physics  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1088/1361-6463/aa5613  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/http://iopscience.iop.org/article/10.1088/1361-6463/aa5613/meta