Artículo

Electrical behavior analysis of n-type CaCu3Ti4O12 thick films exposed to different atmospheres

Ponce, Miguel AdolfoIcon ; Ramirez, M. A.; Schipani, Federico; Joanni, E.; Tomba, Juan PabloIcon ; Castro, Miriam SusanaIcon
Fecha de publicación: 12/09/2014
Editorial: Elsevier
Revista: Journal of the European Ceramic Society
ISSN: 0955-2219
Idioma: Inglés
Tipo de recurso: Artículo publicado
Clasificación temática:

Resumen

In this work n-type CaCu3Ti4O12(CCTO) thick films obtained by screen printing were studied. The role of the potential barrier characteristics(height and width) was considered in order to explain the electrical behavior. The electrical response was also analyzed considering the oxygenadsorption and subsequent diffusion into the grains at temperatures higher than 280◦C. Tunnel currents were also calculated taking into accountthe donor concentration values for films in vacuum atmosphere.
Palabras clave: Semiconductor , Conduction Mechanism , Cacu3ti4o12 , Diffusion
 
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info:eu-repo/semantics/openAccess Excepto donde se diga explícitamente, este item se publica bajo la siguiente descripción: Atribución-NoComercial-SinDerivadas 2.5 Argentina (CC BY-NC-ND 2.5 AR)
Identificadores
URI: http://hdl.handle.net/11336/5864
DOI: http://dx.doi.org/ 10.1016/j.jeurceramsoc.2014.08.041
DOI: http://dx.doi.org/10.1016/j.jeurceramsoc.2014.08.041
URL: http://www.sciencedirect.com/science/article/pii/S0955221914004701
Colecciones
Articulos(CCT - MAR DEL PLATA)
Articulos de CTRO.CIENTIFICO TECNOL.CONICET - MAR DEL PLATA
Articulos(INTEMA)
Articulos de INST.DE INV.EN CIENCIA Y TECNOL.MATERIALES (I)
Citación
Ponce, Miguel Adolfo; Ramirez, M. A.; Schipani, Federico; Joanni, E.; Tomba, Juan Pablo; et al.; Electrical behavior analysis of n-type CaCu3Ti4O12 thick films exposed to different atmospheres; Elsevier; Journal of the European Ceramic Society; 35; 1; 12-9-2014; 153-161
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