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dc.contributor.author
Barrio, J.  
dc.contributor.author
Lozano, G.  
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Lamela, J.  
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Lifante, G.  
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Dorado, Luis Antonio  
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Depine, Ricardo Angel  
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Jaque, F.  
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Míguez, H.  
dc.date.available
2018-08-24T15:34:20Z  
dc.date.issued
2011-04  
dc.identifier.citation
Barrio, J.; Lozano, G.; Lamela, J.; Lifante, G.; Dorado, Luis Antonio; et al.; Analysis of artificial opals by scanning near field optical microscopy; American Institute of Physics; Journal of Applied Physics; 109; 8; 4-2011; 1-5  
dc.identifier.issn
0021-8979  
dc.identifier.uri
http://hdl.handle.net/11336/56963  
dc.description.abstract
Herein we present a detailed analysis of the optical response of artificial opal films realized employing a near-field scanning optical microscope in collection and transmission modes. Near-field patterns measured at the rear surface when a plane wave impinges on the front face are presented with the finding that optical intensity maps present a clear correlation with the periodic arrangement of the outer surface. Calculations based on the vector Korringa-Kohn-Rostoker method reproduce the different profiles experimentally observed as well as the response to the polarization of the incident field. These observations constitute the first experimental confirmation of the collective lattice resonances that give rise to the optical response of these three dimensional periodic structures in the high-energy range. © 2011 American Institute of Physics.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
American Institute of Physics  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
Opals  
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Near Field Microscopy  
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Optical Properties  
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Photonic Crystals  
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Astronomía  
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Ciencias Físicas  
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CIENCIAS NATURALES Y EXACTAS  
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Otras Ciencias Químicas  
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Ciencias Químicas  
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CIENCIAS NATURALES Y EXACTAS  
dc.title
Analysis of artificial opals by scanning near field optical microscopy  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2018-08-23T19:06:50Z  
dc.journal.volume
109  
dc.journal.number
8  
dc.journal.pagination
1-5  
dc.journal.pais
Estados Unidos  
dc.journal.ciudad
Nueva York  
dc.description.fil
Fil: Barrio, J.. Universidad Autónoma de Madrid; España  
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Fil: Lozano, G.. Consejo Superior de Investigaciones Científicas; España  
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Fil: Lamela, J.. Universidad Autónoma de Madrid; España  
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Fil: Lifante, G.. Universidad Autónoma de Madrid; España  
dc.description.fil
Fil: Dorado, Luis Antonio. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Departamento de Física; Argentina  
dc.description.fil
Fil: Depine, Ricardo Angel. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Departamento de Física; Argentina  
dc.description.fil
Fil: Jaque, F.. Universidad Autónoma de Madrid; España  
dc.description.fil
Fil: Míguez, H.. Consejo Superior de Investigaciones Científicas; España  
dc.journal.title
Journal of Applied Physics  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/https://dx.doi.org/10.1063/1.3573777  
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info:eu-repo/semantics/altIdentifier/url/https://aip.scitation.org/doi/10.1063/1.3573777