Graphical analysis of current-voltage characteristics in memristive interfaces

Abstract

A graphical representation of current-voltage (IV) measurements of typical memristive interfaces at constant temperature is presented. This is the starting point to extract relevant microscopic information of the parameters that control the electrical properties of a device based on a particular metal-oxide interface. The convenience of the method is illustrated presenting some examples where the IV characteristics were simulated in order to gain insight into the influence of the fitting parameters.