Artículo
Graphical analysis of current-voltage characteristics in memristive interfaces
Fecha de publicación:
04/2017
Editorial:
American Institute of Physics
Revista:
Journal of Applied Physics
ISSN:
0021-8979
Idioma:
Inglés
Tipo de recurso:
Artículo publicado
Clasificación temática:
Resumen
A graphical representation of current-voltage (IV) measurements of typical memristive interfaces at constant temperature is presented. This is the starting point to extract relevant microscopic information of the parameters that control the electrical properties of a device based on a particular metal-oxide interface. The convenience of the method is illustrated presenting some examples where the IV characteristics were simulated in order to gain insight into the influence of the fitting parameters.
Palabras clave:
Memorias Resistivas
,
Mecanismos de Conducción
,
Características Iv
Archivos asociados
Licencia
Identificadores
Colecciones
Articulos(IFIBA)
Articulos de INST.DE FISICA DE BUENOS AIRES
Articulos de INST.DE FISICA DE BUENOS AIRES
Citación
Acha, Carlos Enrique; Graphical analysis of current-voltage characteristics in memristive interfaces; American Institute of Physics; Journal of Applied Physics; 121; 13; 4-2017; 134502,1-7
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