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dc.contributor.author
Fernandez Corazza, Mariano  
dc.contributor.author
Turovets, Sergei  
dc.contributor.author
Luu, Phan  
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Price, Nick  
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Muravchik, Carlos Horacio  
dc.contributor.author
Tucker, Don  
dc.date.available
2018-06-25T16:01:08Z  
dc.date.issued
2017-11  
dc.identifier.citation
Fernandez Corazza, Mariano; Turovets, Sergei; Luu, Phan; Price, Nick; Muravchik, Carlos Horacio; et al.; Skull modeling effects in conductivity estimates using parametric electrical impedance tomography; Institute of Electrical and Electronics Engineers; Ieee Transactions On Bio-medical Engineering; 11-2017; 1-14  
dc.identifier.issn
0018-9294  
dc.identifier.uri
http://hdl.handle.net/11336/49923  
dc.description.abstract
Objective: To estimate the scalp, skull, compact bone and marrow bone electrical conductivity values based on Electrical Impedance Tomography (EIT) measurements, and to determine the influence of the skull modeling details on the estimates. Methods: We collected EIT data with 62 current injection pairs and built five 6-8 million finite element (FE) head models with different grades of skull simplifications for four subjects, including three whose head models serve as Atlas in the scientific literature and in commercial equipment (Colin27 and EGI's Geosource atlases). We estimated the electrical conductivity of the scalp, skull, marrow bone and compact bone tissues for each current injection pair, each model, and each subject. Results: patching the skull holes in FE models, using four-layer Boundary Element Method-like models, and neglecting the CSF layer produce an overestimation of the skull conductivity of 10%, 10-20%, and 20-30% respectively (accumulated overestimation of 50-70%). The average extracted conductivities are: 288±53 (the scalp), 4.3±0.08 (the compact bone), and 5.5±1.25 (the whole skull) mS/m. The marrow bone estimates showed large dispersion. Conclusion: our EIT estimates for the skull conductivity are lower than typical literature reference values, but the previous in-vivo EIT results are likely overestimated due to the use of simpler models. Significance: the typical literature values of 7-10mS/m for the skull conductivity should be replaced by our new estimates when using detailed skull head models. We also provide subject specific conductivity estimates for widely used Atlas head models.  
dc.format
application/pdf  
dc.language.iso
eng  
dc.publisher
Institute of Electrical and Electronics Engineers  
dc.rights
info:eu-repo/semantics/openAccess  
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/  
dc.subject
Bioimpedance  
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Biomedical Signal Processing  
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Electrical Impedance Tomography  
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Electroencephalography  
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Skull Electrical Conductivity  
dc.subject.classification
Ingeniería de Sistemas y Comunicaciones  
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Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información  
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INGENIERÍAS Y TECNOLOGÍAS  
dc.title
Skull modeling effects in conductivity estimates using parametric electrical impedance tomography  
dc.type
info:eu-repo/semantics/article  
dc.type
info:ar-repo/semantics/artículo  
dc.type
info:eu-repo/semantics/publishedVersion  
dc.date.updated
2018-06-22T15:06:44Z  
dc.identifier.eissn
1558-2531  
dc.journal.pagination
1-14  
dc.journal.pais
Estados Unidos  
dc.description.fil
Fil: Fernandez Corazza, Mariano. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata; Argentina. Universidad Nacional de La Plata. Facultad de Ingeniería. Departamento de Electrotecnia; Argentina  
dc.description.fil
Fil: Turovets, Sergei. University of Oregon; Estados Unidos  
dc.description.fil
Fil: Luu, Phan. University of Oregon; Estados Unidos  
dc.description.fil
Fil: Price, Nick. Electrical Geodesics Inc.; Estados Unidos  
dc.description.fil
Fil: Muravchik, Carlos Horacio. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata; Argentina. Universidad Nacional de La Plata. Facultad de Ingeniería. Departamento de Electrotecnia; Argentina  
dc.description.fil
Fil: Tucker, Don. University of Oregon; Estados Unidos  
dc.journal.title
Ieee Transactions On Bio-medical Engineering  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1109/TBME.2017.2777143  
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://ieeexplore.ieee.org/document/8119547/