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dc.contributor.author
Fernandez Corazza, Mariano
dc.contributor.author
Turovets, Sergei
dc.contributor.author
Luu, Phan
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Price, Nick
dc.contributor.author
Muravchik, Carlos Horacio
dc.contributor.author
Tucker, Don
dc.date.available
2018-06-25T16:01:08Z
dc.date.issued
2017-11
dc.identifier.citation
Fernandez Corazza, Mariano; Turovets, Sergei; Luu, Phan; Price, Nick; Muravchik, Carlos Horacio; et al.; Skull modeling effects in conductivity estimates using parametric electrical impedance tomography; Institute of Electrical and Electronics Engineers; Ieee Transactions On Bio-medical Engineering; 11-2017; 1-14
dc.identifier.issn
0018-9294
dc.identifier.uri
http://hdl.handle.net/11336/49923
dc.description.abstract
Objective: To estimate the scalp, skull, compact bone and marrow bone electrical conductivity values based on Electrical Impedance Tomography (EIT) measurements, and to determine the influence of the skull modeling details on the estimates. Methods: We collected EIT data with 62 current injection pairs and built five 6-8 million finite element (FE) head models with different grades of skull simplifications for four subjects, including three whose head models serve as Atlas in the scientific literature and in commercial equipment (Colin27 and EGI's Geosource atlases). We estimated the electrical conductivity of the scalp, skull, marrow bone and compact bone tissues for each current injection pair, each model, and each subject. Results: patching the skull holes in FE models, using four-layer Boundary Element Method-like models, and neglecting the CSF layer produce an overestimation of the skull conductivity of 10%, 10-20%, and 20-30% respectively (accumulated overestimation of 50-70%). The average extracted conductivities are: 288±53 (the scalp), 4.3±0.08 (the compact bone), and 5.5±1.25 (the whole skull) mS/m. The marrow bone estimates showed large dispersion. Conclusion: our EIT estimates for the skull conductivity are lower than typical literature reference values, but the previous in-vivo EIT results are likely overestimated due to the use of simpler models. Significance: the typical literature values of 7-10mS/m for the skull conductivity should be replaced by our new estimates when using detailed skull head models. We also provide subject specific conductivity estimates for widely used Atlas head models.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
Institute of Electrical and Electronics Engineers
dc.rights
info:eu-repo/semantics/openAccess
dc.rights.uri
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.subject
Bioimpedance
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Biomedical Signal Processing
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Electrical Impedance Tomography
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Electroencephalography
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Skull Electrical Conductivity
dc.subject.classification
Ingeniería de Sistemas y Comunicaciones
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Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Información
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INGENIERÍAS Y TECNOLOGÍAS
dc.title
Skull modeling effects in conductivity estimates using parametric electrical impedance tomography
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2018-06-22T15:06:44Z
dc.identifier.eissn
1558-2531
dc.journal.pagination
1-14
dc.journal.pais
Estados Unidos
dc.description.fil
Fil: Fernandez Corazza, Mariano. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata; Argentina. Universidad Nacional de La Plata. Facultad de Ingeniería. Departamento de Electrotecnia; Argentina
dc.description.fil
Fil: Turovets, Sergei. University of Oregon; Estados Unidos
dc.description.fil
Fil: Luu, Phan. University of Oregon; Estados Unidos
dc.description.fil
Fil: Price, Nick. Electrical Geodesics Inc.; Estados Unidos
dc.description.fil
Fil: Muravchik, Carlos Horacio. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata; Argentina. Universidad Nacional de La Plata. Facultad de Ingeniería. Departamento de Electrotecnia; Argentina
dc.description.fil
Fil: Tucker, Don. University of Oregon; Estados Unidos
dc.journal.title
Ieee Transactions On Bio-medical Engineering
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1109/TBME.2017.2777143
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://ieeexplore.ieee.org/document/8119547/
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