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dc.contributor.author
Martínez Matos, Ó.
dc.contributor.author
Rickenstorff, C.
dc.contributor.author
Zamora, S.
dc.contributor.author
Izquierdo, J. G.
dc.contributor.author
Vaveliuk, Pablo
dc.date.available
2018-06-19T15:39:00Z
dc.date.issued
2017-02
dc.identifier.citation
Martínez Matos, Ó.; Rickenstorff, C.; Zamora, S.; Izquierdo, J. G.; Vaveliuk, Pablo; Characterization of digital dispersive spectrometers by low coherence interferometry; Optical Society of America; Optics Express; 25; 4; 2-2017; 3222-3233
dc.identifier.issn
1094-4087
dc.identifier.uri
http://hdl.handle.net/11336/49266
dc.description.abstract
We propose a procedure to determine the spectral response of digital dispersive spectrometers without previous knowledge of any parameter of the system. The method consists of applying the Fourier transform spectroscopy technique to each pixel of the detection plane, a CCD camera, to obtain its individual spectral response. From this simple procedure, the system-point spread function and the effect of the finite pixel width are taken into account giving rise to a response matrix that fully characterizes the spectrometer. Using the response matrix information we find the resolving power of a given spectrometer, predict in advance its response to any virtual input spectrum and improve numerically the spectrometer's resolution. We consider that the presented approach could be useful in most spectroscopic branches such as in computational spectroscopy, optical coherence tomography, hyperspectral imaging, spectral interferometry and analytical chemistry, among others.
dc.format
application/pdf
dc.language.iso
eng
dc.publisher
Optical Society of America
dc.rights
info:eu-repo/semantics/openAccess
dc.rights.uri
https://creativecommons.org/licenses/by/2.5/ar/
dc.subject
Spectrometers
dc.subject
Interferometry
dc.subject.classification
Astronomía
dc.subject.classification
Ciencias Físicas
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CIENCIAS NATURALES Y EXACTAS
dc.title
Characterization of digital dispersive spectrometers by low coherence interferometry
dc.type
info:eu-repo/semantics/article
dc.type
info:ar-repo/semantics/artículo
dc.type
info:eu-repo/semantics/publishedVersion
dc.date.updated
2018-06-18T21:21:24Z
dc.journal.volume
25
dc.journal.number
4
dc.journal.pagination
3222-3233
dc.journal.pais
Estados Unidos
dc.journal.ciudad
Washington DC
dc.description.fil
Fil: Martínez Matos, Ó.. Universidad Complutense de Madrid; España
dc.description.fil
Fil: Rickenstorff, C.. Universidad Complutense de Madrid; España
dc.description.fil
Fil: Zamora, S.. Universidad Complutense de Madrid; España
dc.description.fil
Fil: Izquierdo, J. G.. Universidad Complutense de Madrid; España
dc.description.fil
Fil: Vaveliuk, Pablo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Centro de Investigaciones Ópticas. Provincia de Buenos Aires. Gobernación. Comisión de Investigaciones Científicas. Centro de Investigaciones Ópticas. Universidad Nacional de La Plata. Centro de Investigaciones Ópticas; Argentina
dc.journal.title
Optics Express
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1364/OE.25.003222
dc.relation.alternativeid
info:eu-repo/semantics/altIdentifier/url/https://www.osapublishing.org/oe/abstract.cfm?uri=oe-25-4-3222
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